Keitarou Kondou

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer comprising a reagent container holder
- Patent number 9,248,451
- Issue date Feb 2, 2016
- Sysmex Corporation
- Keitarou Kondou
- G01 - MEASURING TESTING
Information Patent Grant
Sample measuring apparatus, reagent information displaying method a...
- Patent number 9,227,190
- Issue date Jan 5, 2016
- Sysmex Corporation
- Keitarou Kondou
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer, reagent information displaying method and computer...
- Patent number 8,741,229
- Issue date Jun 3, 2014
- Sysmex Corporation
- Keitarou Kondou
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer, sample analyzing method, and computer program product
- Patent number 8,460,935
- Issue date Jun 11, 2013
- Sysmex Corporation
- Hiroshi Kurono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND COMPUTER PROGRAM PRODUCT
- Publication number 20100210019
- Publication date Aug 19, 2010
- SYSMEX CORPORATION
- Hiroshi KURONO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING APPARATUS, REAGENT INFORMATION DISPLAYING METHOD A...
- Publication number 20100114501
- Publication date May 6, 2010
- SYSMEX CORPORATION
- Keitarou Kondou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER, REAGENT INFORMATION DISPLAYING METHOD AND COMPUTER...
- Publication number 20100115463
- Publication date May 6, 2010
- SYSMEX CORPORATION
- Keitarou KONDOU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND COMPUTER PROGRAM PRODUCT
- Publication number 20090224032
- Publication date Sep 10, 2009
- SYSMEX CORPORATION
- Keitarou KONDOU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS APPARATUS, SAMPLE ANALYSIS METHOD, AND COMPUTER PRO...
- Publication number 20090221090
- Publication date Sep 3, 2009
- SYSMEX CORPORATION
- Keitarou KONDOU
- G01 - MEASURING TESTING