Keith A. Jenkins

Person

Sleepy Hollow, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Degradation monitoring of semiconductor chips
- Patent number 11,131,706
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring individual device degradation in CMOS circuits
- Patent number 10,901,025
- Issue date Jan 26, 2021
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Grant
BTI degradation test circuit
- Patent number 10,782,336
- Issue date Sep 22, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic predictor of semiconductor lifetime limits
- Patent number 10,746,785
- Issue date Aug 18, 2020
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Grant
Duty cycle measurement
- Patent number 10,739,391
- Issue date Aug 11, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Analytics to determine customer satisfaction
- Patent number 10,671,958
- Issue date Jun 2, 2020
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ring oscillator structures to determine local voltage value
- Patent number 10,574,240
- Issue date Feb 25, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dielectric breakdown monitor
- Patent number 10,564,213
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Tam N. Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,552,278
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Remote monitoring of software
- Patent number 10,491,610
- Issue date Nov 26, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Touch movement activation for gaining access beyond a restricted ac...
- Patent number 10,433,173
- Issue date Oct 1, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip combined hot carrier injection and bias temperature instabi...
- Patent number 10,388,580
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Autonomic supply voltage compensation for degradation of circuits o...
- Patent number 10,365,702
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analytics to determine customer satisfaction
- Patent number 10,360,526
- Issue date Jul 23, 2019
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electromigration wearout detection circuits
- Patent number 10,295,589
- Issue date May 21, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measuring individual device degradation in CMOS circuits
- Patent number 10,247,769
- Issue date Apr 2, 2019
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,102,090
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultra-broadband switched inductor oscillator
- Patent number 10,075,131
- Issue date Sep 11, 2018
- International Business Machines Corporation
- Shu-Jen Han
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip combined hot carrier injection and bias temperature instabi...
- Patent number 10,002,810
- Issue date Jun 19, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement for transistor output characteristics with and without...
- Patent number 9,952,274
- Issue date Apr 24, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Touch movement activation for gaining access beyond a restricted ac...
- Patent number 9,906,960
- Issue date Feb 27, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-chip leakage measurement
- Patent number 9,863,994
- Issue date Jan 9, 2018
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit to isolate HCI degradation
- Patent number 9,866,221
- Issue date Jan 9, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Remote sensing using pulse-width modulation
- Patent number 9,835,584
- Issue date Dec 5, 2017
- International Business Machines Corporation
- Shu-Jen Han
- G01 - MEASURING TESTING
Information Patent Grant
Remote sensing using pulse-width modulation
- Patent number 9,835,583
- Issue date Dec 5, 2017
- International Business Machines Corporation
- Shu-Jen Han
- G01 - MEASURING TESTING
Information Patent Grant
Test structure to measure delay variability mismatch of digital log...
- Patent number 9,829,535
- Issue date Nov 28, 2017
- International Business Machines Corporation
- Karthik Balakrishnan
- G01 - MEASURING TESTING
Information Patent Grant
Duty cycle measurement
- Patent number 9,817,047
- Issue date Nov 14, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit to detect previous use of computer chips using passive test...
- Patent number 9,791,500
- Issue date Oct 17, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit to detect previous use of computer chips using passive test...
- Patent number 9,791,499
- Issue date Oct 17, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Carbon nanotube array for cryptographic key generation and protection
- Patent number 9,787,473
- Issue date Oct 10, 2017
- International Business Machines Corporation
- Wilfried Haensch
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
ANALYTICS TO DETERMINE CUSTOMER SATISFACTION
- Publication number 20190266538
- Publication date Aug 29, 2019
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING INDIVIDUAL DEVICE DEGRADATION IN CMOS CIRCUITS
- Publication number 20180364296
- Publication date Dec 20, 2018
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20180322025
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Autonomic Supply Voltage Compensation for Degradation of Circuits o...
- Publication number 20180292879
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RING OSCILLATOR STRUCTURES TO DETERMINE LOCAL VOLTAGE VALUE
- Publication number 20180248555
- Publication date Aug 30, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIELECTRIC BREAKDOWN MONITOR
- Publication number 20180246159
- Publication date Aug 30, 2018
- International Business Machines Corporation
- Tam N. Huynh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABI...
- Publication number 20180211894
- Publication date Jul 26, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DYNAMIC PREDICTOR OF SEMICONDUCTOR LIFETIME LIMITS
- Publication number 20180038906
- Publication date Feb 8, 2018
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...
- Publication number 20180035298
- Publication date Feb 1, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ANALYTICS TO DETERMINE CUSTOMER SATISFACTION
- Publication number 20180032939
- Publication date Feb 1, 2018
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUTY CYCLE MEASUREMENT
- Publication number 20170350928
- Publication date Dec 7, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT TO ISOLATE HCI DEGRADATION
- Publication number 20170346492
- Publication date Nov 30, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
REMOTE MONITORING OF SOFTWARE
- Publication number 20170339167
- Publication date Nov 23, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20170329685
- Publication date Nov 16, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...
- Publication number 20170325093
- Publication date Nov 9, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ULTRA-BROADBAND SWITCHED INDUCTOR OSCILLATOR
- Publication number 20170310277
- Publication date Oct 26, 2017
- International Business Machines Corporation
- Shu-Jen Han
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BTI DEGRADATION TEST CIRCUIT
- Publication number 20170276728
- Publication date Sep 28, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMIGRATION WEAROUT DETECTION CIRCUITS
- Publication number 20170269152
- Publication date Sep 21, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP LEAKAGE MEASUREMENT
- Publication number 20170254846
- Publication date Sep 7, 2017
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
DEGRADATION MONITORING OF SEMICONDUCTOR CHIPS
- Publication number 20170160339
- Publication date Jun 8, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
DUTY CYCLE MEASUREMENT
- Publication number 20170102420
- Publication date Apr 13, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
Carbon Nanotube Array for Cryptographic Key Generation and Protection
- Publication number 20170063543
- Publication date Mar 2, 2017
- International Business Machines Corporation
- Wilfried Haensch
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASURING INDIVIDUAL DEVICE DEGRADATION IN CMOS CIRCUITS
- Publication number 20170059644
- Publication date Mar 2, 2017
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABI...
- Publication number 20160377672
- Publication date Dec 29, 2016
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
CARBON BASED CMOS SENSOR RING OSCILLATOR
- Publication number 20160377566
- Publication date Dec 29, 2016
- International Business Machines Corporation
- Shu-Jen Han
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUSLY MEASURING DEGRADATION IN MULTIPLE FETS
- Publication number 20160341785
- Publication date Nov 24, 2016
- International Business Machines Corporation
- Karthik Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TO DETECT PREVIOUS USE OF COMPUTER CHIPS USING PASSIVE TEST...
- Publication number 20160341788
- Publication date Nov 24, 2016
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
REMOTE SENSING USING PULSE-WIDTH MODULATION
- Publication number 20160313276
- Publication date Oct 27, 2016
- International Business Machines Corporation
- Shu-Jen Han
- G01 - MEASURING TESTING
Information Patent Application
REMOTE SENSING USING PULSE-WIDTH MODULATION
- Publication number 20160313275
- Publication date Oct 27, 2016
- International Business Machines Corporation
- Shu-Jen Han
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT FOR TRANSISTOR OUTPUT CHARACTERISTICS WITH AND WITHOUT...
- Publication number 20160266195
- Publication date Sep 15, 2016
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING

Keith A. Jenkins

Person

Patents Grantslast 30 patents

Degradation monitoring of semiconductor chips

Measuring individual device degradation in CMOS circuits

BTI degradation test circuit

Dynamic predictor of semiconductor lifetime limits

Duty cycle measurement

Analytics to determine customer satisfaction

Ring oscillator structures to determine local voltage value

Dielectric breakdown monitor

Non-destructive analysis to determine use history of processor

Remote monitoring of software

Touch movement activation for gaining access beyond a restricted ac...

On-chip combined hot carrier injection and bias temperature instabi...

Autonomic supply voltage compensation for degradation of circuits o...

Analytics to determine customer satisfaction

Electromigration wearout detection circuits

Measuring individual device degradation in CMOS circuits

Non-destructive analysis to determine use history of processor

Ultra-broadband switched inductor oscillator

On-chip combined hot carrier injection and bias temperature instabi...

Measurement for transistor output characteristics with and without...

Touch movement activation for gaining access beyond a restricted ac...

On-chip leakage measurement

Test circuit to isolate HCI degradation

Remote sensing using pulse-width modulation

Remote sensing using pulse-width modulation

Test structure to measure delay variability mismatch of digital log...

Duty cycle measurement

Circuit to detect previous use of computer chips using passive test...

Circuit to detect previous use of computer chips using passive test...

Carbon nanotube array for cryptographic key generation and protection

Patents Applicationslast 30 patents

ANALYTICS TO DETERMINE CUSTOMER SATISFACTION

MEASURING INDIVIDUAL DEVICE DEGRADATION IN CMOS CIRCUITS

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

Autonomic Supply Voltage Compensation for Degradation of Circuits o...

RING OSCILLATOR STRUCTURES TO DETERMINE LOCAL VOLTAGE VALUE

DIELECTRIC BREAKDOWN MONITOR

ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABI...

DYNAMIC PREDICTOR OF SEMICONDUCTOR LIFETIME LIMITS

TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...

ANALYTICS TO DETERMINE CUSTOMER SATISFACTION

DUTY CYCLE MEASUREMENT

TEST CIRCUIT TO ISOLATE HCI DEGRADATION

REMOTE MONITORING OF SOFTWARE

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...

ULTRA-BROADBAND SWITCHED INDUCTOR OSCILLATOR

BTI DEGRADATION TEST CIRCUIT

ELECTROMIGRATION WEAROUT DETECTION CIRCUITS

ON-CHIP LEAKAGE MEASUREMENT

DEGRADATION MONITORING OF SEMICONDUCTOR CHIPS

DUTY CYCLE MEASUREMENT

Carbon Nanotube Array for Cryptographic Key Generation and Protection

MEASURING INDIVIDUAL DEVICE DEGRADATION IN CMOS CIRCUITS

ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABI...

CARBON BASED CMOS SENSOR RING OSCILLATOR

SIMULTANEOUSLY MEASURING DEGRADATION IN MULTIPLE FETS

CIRCUIT TO DETECT PREVIOUS USE OF COMPUTER CHIPS USING PASSIVE TEST...

REMOTE SENSING USING PULSE-WIDTH MODULATION

REMOTE SENSING USING PULSE-WIDTH MODULATION

MEASUREMENT FOR TRANSISTOR OUTPUT CHARACTERISTICS WITH AND WITHOUT...