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Keith A. Nelson
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Newton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Synchronous excitation of multiple shock waves
Patent number
12,148,536
Issue date
Nov 19, 2024
Massachusetts Institute of Technology
Keith Nelson
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Systems, apparatus, and methods of nonlinear terahertz (THz) magnet...
Patent number
10,495,703
Issue date
Dec 3, 2019
Massachusetts Institute of Technology
Harold Young Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for quality control of a periodic structure
Patent number
10,241,058
Issue date
Mar 26, 2019
Massachusetts Institute of Technology
Alexei Maznev
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Grant
Detection of electromagnetic radiation using nonlinear materials
Patent number
10,024,723
Issue date
Jul 17, 2018
Massachusetts Institute of Technology
Harold Y. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems, apparatus, and methods of nonlinear terahertz (THz) magnet...
Patent number
9,945,914
Issue date
Apr 17, 2018
Massachusetts Institute of Technology
Harold Young Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional spectroscopy system and two-dimensional spectroscop...
Patent number
9,829,379
Issue date
Nov 28, 2017
Samsung Electronics Co., Ltd.
Chan-Wook Baik
G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods, and apparatus for radiation detection
Patent number
9,810,578
Issue date
Nov 7, 2017
Massachusetts Institute of Technology
Brandt Christopher Pein
G01 - MEASURING TESTING
Information
Patent Grant
Detection of electromagnetic radiation using nonlinear materials
Patent number
9,366,576
Issue date
Jun 14, 2016
Massachusetts Institute of Technology
Harold Y. Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Multidimensional pulse shaper and spectrometer
Patent number
9,074,936
Issue date
Jul 7, 2015
Massachusetts Institute of Technology
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Detection of electromagnetic radiation using nonlinear materials
Patent number
9,000,376
Issue date
Apr 7, 2015
Massachusettes Institute of Technology
Harold Y. Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Phase-matched terahertz emitter
Patent number
7,601,977
Issue date
Oct 13, 2009
Massachusetts Institute of Technology
Ka-Lo Yeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Diffraction-based pulse shaping with a 2D optical modulator
Patent number
7,495,816
Issue date
Feb 24, 2009
Massachusetts Institute of Technology
Joshua Vaughan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Characterization of materials with optically shaped acoustic waveforms
Patent number
7,387,027
Issue date
Jun 17, 2008
Massachusetts Institute of Technology
Jaime D. Choi
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Grant
Acceleration of charged particles using spatially and temporally sh...
Patent number
7,348,569
Issue date
Mar 25, 2008
Massachusetts Institute of Technology
Thomas Feurer
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and device for measuring thin films and semiconductor substr...
Patent number
6,795,198
Issue date
Sep 21, 2004
Martin Fuchs
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic wavelength shifting method
Patent number
6,717,717
Issue date
Apr 6, 2004
Massachusetts Institute of Technology
Keith A. Nelson
G02 - OPTICS
Information
Patent Grant
System and Method for terahertz frequency measurements
Patent number
6,479,822
Issue date
Nov 12, 2002
Massachusetts Institute of Technology
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Polariton wave imaging
Patent number
6,356,349
Issue date
Mar 12, 2002
Massachusetts Institute of Technology
Richard A. Koehl
G01 - MEASURING TESTING
Information
Patent Grant
Method and device using x-rays to measure thickness and composition...
Patent number
6,349,128
Issue date
Feb 19, 2002
Philips Electronics North America Corporation
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring the thickness of opaque and transpa...
Patent number
6,348,967
Issue date
Feb 19, 2002
Active Impulse Systems, Inc.
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Methods and system for optically correlating ultrashort optical wav...
Patent number
6,204,926
Issue date
Mar 20, 2001
Massachusetts Institute of Technology
Alexi A. Maznev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for measuring the thickness of opaque and transpa...
Patent number
6,081,330
Issue date
Jun 27, 2000
Active Impulse Systems, Inc.
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Signal processing by optically manipulating polaritons
Patent number
6,075,640
Issue date
Jun 13, 2000
Massachusetts Institute of Technology
Keith A. Nelson
G02 - OPTICS
Information
Patent Grant
Method and device for simultaneously measuring the thickness of mul...
Patent number
6,069,703
Issue date
May 30, 2000
Active Impulse Systems, Inc.
Matthew J. Banet
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for introducing electromagnetic radiation into...
Patent number
5,999,308
Issue date
Dec 7, 1999
Massachusetts Institute of Technology
Keith A. Nelson
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Determining the presence of defects in thin film structures
Patent number
5,982,482
Issue date
Nov 9, 1999
Massachusetts Institute of Technology
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring the thickness of opaque and transpa...
Patent number
5,812,261
Issue date
Sep 22, 1998
Active Impulse Systems, Inc.
Keith A. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for time-resolved optical measurements
Patent number
5,734,470
Issue date
Mar 31, 1998
Massachusetts Institute of Technology
John A. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
High-fidelity spatial light modulator
Patent number
5,719,650
Issue date
Feb 17, 1998
Massachusetts Institute of Technology
Marc M. Wefers
G02 - OPTICS
Information
Patent Grant
Method and device for generating spatially and temporally shaped op...
Patent number
5,682,262
Issue date
Oct 28, 1997
Massachusetts Institute of Technology
Marc M. Wefers
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS FOR LASER-DRIVEN INERTIAL CONFINEMENT AND TRITIUM PRODUCTION
Publication number
20250104883
Publication date
Mar 27, 2025
Massachusetts Institute of Technology
Keith A. NELSON
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
TERAHERTZ WAVE-VISIBLE LIGHT CONVERSION DEVICE AND IMAGE SENSING DE...
Publication number
20230163154
Publication date
May 25, 2023
Samsung Electronics Co., Ltd.
Chanwook BAIK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Synchronous Excitation Of Multiple Shock Waves For Fusion
Publication number
20210110937
Publication date
Apr 15, 2021
Massachusetts Institute of Technology
Keith Nelson
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Systems, Apparatus, and Methods of Nonlinear Terahertz (THz) Magnet...
Publication number
20190086486
Publication date
Mar 21, 2019
Massachusetts Institute of Technology
Harold Young Hwang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, METHODS, AND APPARATUS FOR RADIATION DETECTION
Publication number
20180100767
Publication date
Apr 12, 2018
Brandt Christopher Pein
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Quality Control of a Periodic Structure
Publication number
20180011031
Publication date
Jan 11, 2018
Alexei Maznev
G01 - MEASURING TESTING
Information
Patent Application
Systems, Apparatus, and Methods of Nonlinear Terahertz (THz) Magnet...
Publication number
20170336482
Publication date
Nov 23, 2017
Harold Young HWANG
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF ELECTROMAGNETIC RADIATION USING NONLINEAR MATERIALS
Publication number
20170131148
Publication date
May 11, 2017
Massachusetts Institute of Technology
Harold Y. Hwang
G01 - MEASURING TESTING
Information
Patent Application
Systems, Methods, and Apparatus for Radiation Detection
Publication number
20160258807
Publication date
Sep 8, 2016
Brandt Christopher Pein
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL SPECTROSCOPY SYSTEM AND TWO-DIMENSIONAL SPECTROSCOP...
Publication number
20160131527
Publication date
May 12, 2016
Massachusetts Institute of Technology
Chan-Wook BAIK
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF ELECTROMAGNETIC RADIATION USING NONLINEAR MATERIALS
Publication number
20150285687
Publication date
Oct 8, 2015
Massachusetts Institute of Technology
Harold Y. Hwang
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF ELECTROMAGNETIC RADIATION USING NONLINEAR MATERIALS
Publication number
20140061469
Publication date
Mar 6, 2014
Harold Y. Hwang
G01 - MEASURING TESTING
Information
Patent Application
MULTIDIMENSIONAL PULSE SHAPER AND SPECTROMETER
Publication number
20090116009
Publication date
May 7, 2009
Keith A. Nelson
G02 - OPTICS
Information
Patent Application
Phase-matched terahertz emitter
Publication number
20080265165
Publication date
Oct 30, 2008
Ka-Lo Yeh
G02 - OPTICS
Information
Patent Application
Characterization of materials with optically shaped acoustic waveforms
Publication number
20060027021
Publication date
Feb 9, 2006
Jaime D. Choi
G01 - MEASURING TESTING
Information
Patent Application
Diffraction-based pulse shaping with a 2D optical modulator
Publication number
20060017999
Publication date
Jan 26, 2006
Joshua Vaughan
G02 - OPTICS
Information
Patent Application
Acceleration of charged particles using spatially and temporally sh...
Publication number
20050279947
Publication date
Dec 22, 2005
Thomas Feurer
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Dynamic wavelength shifting method
Publication number
20030011871
Publication date
Jan 16, 2003
Keith A. Nelson
G02 - OPTICS