Keith B. Wells

Person

Santa Cruz, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Atomic layer etch and deposition processing systems including a len...
- Patent number 11,984,330
- Issue date May 14, 2024
- Lam Research Corporation
- Dong Woo Paeng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Defect classification and source analysis for semiconductor equipment
- Patent number 11,263,737
- Issue date Mar 1, 2022
- Lam Research Corporation
- Kapil Sawlani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating high resolution images from low resolution images for se...
- Patent number 10,648,924
- Issue date May 12, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical die to database inspection
- Patent number 10,012,599
- Issue date Jul 3, 2018
- KLA-Tencor Corp.
- Keith Wells
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid inspectors
- Patent number 9,916,965
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical die to database inspection
- Patent number 9,915,625
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection with focus volumetric method
- Patent number 9,816,940
- Issue date Nov 14, 2017
- KLA-Tencor Corporation
- Grace H. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 7,477,372
- Issue date Jan 13, 2009
- KLA-Tencor Technologies Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 7,075,637
- Issue date Jul 11, 2006
- KLA-Tencor Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for simultaneous or sequential multi-perspectiv...
- Patent number 6,922,236
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corp.
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 6,888,627
- Issue date May 3, 2005
- KLA-Tencor Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 6,081,325
- Issue date Jun 27, 2000
- KLA-Tencor Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system
- Patent number 5,864,394
- Issue date Jan 26, 1999
- KLA-Tencor Corporation
- John R. Jordan
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection system employing a subsystem for collecting scat...
- Patent number 5,604,585
- Issue date Feb 18, 1997
- Tencor Instruments
- Ralph Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Optical wafer positioning system
- Patent number 5,530,550
- Issue date Jun 25, 1996
- Tencor Instruments
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Process for inspecting patterned wafers
- Patent number 5,355,212
- Issue date Oct 11, 1994
- Tencor Instruments
- Keith B. Wells
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Subsurface alignment metrology system for packaging applications
- Publication number 20240170317
- Publication date May 23, 2024
- Venkatakaushik VOLETI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT CLASSIFICATION AND SOURCE ANALYSIS FOR SEMICONDUCTOR EQUIPMENT
- Publication number 20220270237
- Publication date Aug 25, 2022
- LAM RESEARCH CORPORATION
- Kapil Sawlani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATOMIC LAYER ETCH AND DEPOSITION PROCESSING SYSTEMS INCLUDING A LEN...
- Publication number 20210143032
- Publication date May 13, 2021
- LAM RESEARCH CORPORATION
- Dong Woo PAENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DEFECT CLASSIFICATION AND SOURCE ANALYSIS FOR SEMICONDUCTOR EQUIPMENT
- Publication number 20200226742
- Publication date Jul 16, 2020
- LAM RESEARCH CORPORATION
- Kapil Sawlani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...
- Publication number 20170193680
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTORS
- Publication number 20170194126
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Application
Optical Die to Database Inspection
- Publication number 20170191948
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Lisheng Gao
- G01 - MEASURING TESTING
Information Patent Application
Optical Die to Database Inspection
- Publication number 20160290934
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Keith Wells
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION WITH FOCUS VOLUMETRIC METHOD
- Publication number 20160209334
- Publication date Jul 21, 2016
- KLA-Tencor Corporation
- Grace H. Chen
- G01 - MEASURING TESTING
Information Patent Application
Optical Scanning System For Surface Inspection
- Publication number 20070188744
- Publication date Aug 16, 2007
- KLA-Tencor Technologies Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Optical Scanning System for Surface Inspection
- Publication number 20060203235
- Publication date Sep 14, 2006
- KLA-Tencor Technologies Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Scanning system for inspecting anamolies on surfaces
- Publication number 20050110986
- Publication date May 26, 2005
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Optical scanning system for surface inspection
- Publication number 20030227619
- Publication date Dec 11, 2003
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Optical scanning system for surface inspection
- Publication number 20030206294
- Publication date Nov 6, 2003
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for simultaneous or sequential multi-perspectiv...
- Publication number 20030011760
- Publication date Jan 16, 2003
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Scanning system for inspecting anamolies on surfaces
- Publication number 20020097393
- Publication date Jul 25, 2002
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING

Keith B. Wells

Person

Patents Grantslast 30 patents

Atomic layer etch and deposition processing systems including a len...

Defect classification and source analysis for semiconductor equipment

Generating high resolution images from low resolution images for se...

Optical die to database inspection

Hybrid inspectors

Optical die to database inspection

Wafer inspection with focus volumetric method

Optical scanning system for surface inspection

Optical scanning system for surface inspection

Systems and methods for simultaneous or sequential multi-perspectiv...

Optical scanning system for surface inspection

Optical scanning system for surface inspection

Surface inspection system

Particle detection system employing a subsystem for collecting scat...

Optical wafer positioning system

Process for inspecting patterned wafers

Patents Applicationslast 30 patents

Subsurface alignment metrology system for packaging applications

DEFECT CLASSIFICATION AND SOURCE ANALYSIS FOR SEMICONDUCTOR EQUIPMENT

ATOMIC LAYER ETCH AND DEPOSITION PROCESSING SYSTEMS INCLUDING A LEN...

DEFECT CLASSIFICATION AND SOURCE ANALYSIS FOR SEMICONDUCTOR EQUIPMENT

GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...

HYBRID INSPECTORS

Optical Die to Database Inspection

Optical Die to Database Inspection

WAFER INSPECTION WITH FOCUS VOLUMETRIC METHOD

Optical Scanning System For Surface Inspection

Optical Scanning System for Surface Inspection

Scanning system for inspecting anamolies on surfaces

Optical scanning system for surface inspection

Optical scanning system for surface inspection

Systems and methods for simultaneous or sequential multi-perspectiv...

Scanning system for inspecting anamolies on surfaces