Keith E. Barton

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Hyde Park, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of TEM sample preparation for electron holography for semico...
- Patent number 7,560,692
- Issue date Jul 14, 2009
- International Business Machines Corporation
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Grant
IC chip uniform delayering methods
- Patent number 7,504,337
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Grant
System and method for aligning and supporting interconnect systems
- Patent number 7,079,381
- Issue date Jul 18, 2006
- International Business Machines Corporation
- George W. Brehm
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
IC CHIP UNIFORM DELAYERING METHODS
- Publication number 20080233751
- Publication date Sep 25, 2008
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TEM SAMPLE PREPARATION FOR ELECTRON HOLOGRAPHY FOR SEMICO...
- Publication number 20080156987
- Publication date Jul 3, 2008
- International Business Machines Corporation
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Application
System and method for aligning and supporting interconnect systems
- Publication number 20050146855
- Publication date Jul 7, 2005
- International Business Machines Corporation
- George W. Brehm
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR