Keith E. Jones

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
High-frequency active probe having replaceable contact needles
- Patent number 5,045,781
- Issue date Sep 3, 1991
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency active probe having replaceable contact needles
- Patent number 5,006,793
- Issue date Apr 9, 1991
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
System for facilitating planar probe measurements of high-speed int...
- Patent number 4,994,737
- Issue date Feb 19, 1991
- Cascade Microtech, Inc.
- Dale E. Carlton
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for microstrip assemblies
- Patent number 4,961,050
- Issue date Oct 2, 1990
- Cascade Microtech, Inc.
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
Overlap interfaces between coplanar transmission lines which are to...
- Patent number 4,891,612
- Issue date Jan 2, 1990
- Cascade Microtech, Inc.
- K. Reed Gleason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for setting reference reactance for vector corrected measure...
- Patent number 4,858,160
- Issue date Aug 15, 1989
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Microwave wafer probe having replaceable probe tip
- Patent number 4,849,689
- Issue date Jul 18, 1989
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING

Keith E. Jones

Person

Patents Grantslast 30 patents

High-frequency active probe having replaceable contact needles

High-frequency active probe having replaceable contact needles

System for facilitating planar probe measurements of high-speed int...

Test fixture for microstrip assemblies

Overlap interfaces between coplanar transmission lines which are to...

System for setting reference reactance for vector corrected measure...

Microwave wafer probe having replaceable probe tip