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Keith G. Newman
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Solder interconnect integrity monitor
Patent number
7,478,741
Issue date
Jan 20, 2009
Sun Microsystems, Inc.
Keith G. Newman
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Integrated strain gages for board strain characterization
Patent number
7,036,387
Issue date
May 2, 2006
Sun Microsystems, Inc.
Brett C. Ong
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for solder joint integrity assessment
Patent number
6,371,355
Issue date
Apr 16, 2002
Sun Microsystems, Inc.
Keith G. Newman
G01 - MEASURING TESTING
Information
Patent Grant
Method of making integrated circuit package having multiple bonding...
Patent number
5,490,324
Issue date
Feb 13, 1996
LSI Logic Corporation
Keith G. Newman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit package lid
Patent number
5,455,456
Issue date
Oct 3, 1995
LSI Logic Corporation
Keith G. Newman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for controlling adhesive spreading when attach...
Patent number
5,409,863
Issue date
Apr 25, 1995
LSI Logic Corporation
Keith G. Newman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for fabricating IC packages from laminated boards...
Patent number
5,357,672
Issue date
Oct 25, 1994
LSI Logic Corporation
Keith G. Newman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integral dam and heat sink for semiconductor device assembly
Patent number
5,227,663
Issue date
Jul 13, 1993
LSI Logic Corporation
Sadanand Patil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of making a flexible heater comprising a conductive polymer
Patent number
4,919,744
Issue date
Apr 24, 1990
Raychem Corporation
Keith G. Newman
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Integrated strain gages for board strain characterization
Publication number
20050252311
Publication date
Nov 17, 2005
Sun Microsystems, Inc.
Brett C. Ong
G01 - MEASURING TESTING