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Keith J. Martin
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Hillsboro, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Prism-mask for angled patterning applications
Patent number
11,506,982
Issue date
Nov 22, 2022
Intel Corporation
Vahidreza Parichehreh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Probe tip formation for die sort and test
Patent number
9,823,273
Issue date
Nov 21, 2017
Intel Corporation
Keith J. Martin
G01 - MEASURING TESTING
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Patent Grant
Anti-rotation for wire probes in a probe head of a die tester
Patent number
9,535,095
Issue date
Jan 3, 2017
Intel Corporation
David Shia
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PRISM-MASK FOR ANGLED PATTERNING APPLICATIONS
Publication number
20200096873
Publication date
Mar 26, 2020
Vahidreza PARICHEHREH
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PROBE TIP FORMATION FOR DIE SORT AND TEST
Publication number
20150002181
Publication date
Jan 1, 2015
Keith J. Martin
G01 - MEASURING TESTING