Keith Melcher

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for production of high purity silicon solids and...
- Patent number 9,023,289
- Issue date May 5, 2015
- Texas Instruments Incorporated
- Michael Louis Hayden
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
System and method for production of high purity silicon solids and...
- Patent number 8,277,768
- Issue date Oct 2, 2012
- Texas Instruments Incorporated
- Michael Louis Hayden
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Adjustable lithography blocking device and method
- Patent number 7,598,507
- Issue date Oct 6, 2009
- Texas Instruments Incorporated
- Basab Chatterjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Error reduction in semiconductor processes
- Patent number 6,848,066
- Issue date Jan 25, 2005
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor wafer edge marking
- Patent number 6,710,364
- Issue date Mar 23, 2004
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Error reduction in semiconductor processes
- Patent number 6,645,684
- Issue date Nov 11, 2003
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor wafer edge marking
- Patent number 6,420,792
- Issue date Jul 16, 2002
- Texas Instruments Incorporated
- Richard L. Guldi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Robot crash sensor system
- Patent number 6,298,282
- Issue date Oct 2, 2001
- Texas Instruments Incorporated
- Richard L. Guldi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR PRODUCTION OF HIGH PURITY SILICON SOLIDS AND...
- Publication number 20130302612
- Publication date Nov 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Michael Louis HAYDEN
- C01 - INORGANIC CHEMISTRY
Information Patent Application
SYSTEM AND METHOD FOR PRODUCTION OF HIGH PURITY SILICON SOLIDS AND...
- Publication number 20100124527
- Publication date May 20, 2010
- Texas Instruments Inc.
- Michael Louis Hayden
- C01 - INORGANIC CHEMISTRY
Information Patent Application
Adjustable lithography blocking device and method
- Publication number 20040251429
- Publication date Dec 16, 2004
- Texas Instruments, Incorporated
- Basab Chatterjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor wafer edge marking
- Publication number 20040104361
- Publication date Jun 3, 2004
- Richard L. Guldi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Error reduction in semiconductor processes
- Publication number 20040029029
- Publication date Feb 12, 2004
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Error reduction in semiconductor processes
- Publication number 20030068833
- Publication date Apr 10, 2003
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor wafer edge marking
- Publication number 20020153620
- Publication date Oct 24, 2002
- Richard L. Guldi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Keith Melcher

Person

Patents Grantslast 30 patents

System and method for production of high purity silicon solids and...

System and method for production of high purity silicon solids and...

Adjustable lithography blocking device and method

Error reduction in semiconductor processes

Semiconductor wafer edge marking

Error reduction in semiconductor processes

Semiconductor wafer edge marking

Robot crash sensor system

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR PRODUCTION OF HIGH PURITY SILICON SOLIDS AND...

SYSTEM AND METHOD FOR PRODUCTION OF HIGH PURITY SILICON SOLIDS AND...

Adjustable lithography blocking device and method

Semiconductor wafer edge marking

Error reduction in semiconductor processes

Error reduction in semiconductor processes

Semiconductor wafer edge marking