Keith Tabakman

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Fishkill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of performing measurement sampling of lots in a manufacturin...
- Patent number 7,895,008
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device defect type determination method and structure
- Patent number 7,781,239
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of data weighted object orientation for data mining
- Patent number 7,751,920
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Thomas P. Moyer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PERFORMING MEASUREMENT SAMPLING OF LOTS IN A MANUFACTURIN...
- Publication number 20090234485
- Publication date Sep 17, 2009
- International Business Machines Corporation
- Gary W. Behm
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE DEFECT TYPE DETERMINATION METHOD AND STRUCTURE
- Publication number 20090179661
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF DATA WEIGHTED OBJECT ORIENTATION FOR DATA MINING
- Publication number 20080140247
- Publication date Jun 12, 2008
- International Business Machines Corporation
- Thomas P. Moyer
- G01 - MEASURING TESTING