Keizo Yamada

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Battery system
- Patent number 10,461,545
- Issue date Oct 29, 2019
- Hitachi Chemical Company, Ltd.
- Takeshi Inoue
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Direct-current power source apparatus
- Patent number 8,581,557
- Issue date Nov 12, 2013
- Shin-Kobe Electric Machinery Co., Ltd.
- Mitsuyoshi Kanoh
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Battery state determining apparatus
- Patent number 8,036,839
- Issue date Oct 11, 2011
- Shin-Kobe Electric Machinery Co., Ltd.
- Yoshiaki Machiyama
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Surface contamination analyzer for semiconductor wafers
- Patent number 7,795,593
- Issue date Sep 14, 2010
- Topcon Corporation
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 7,700,380
- Issue date Apr 20, 2010
- Topcon Corporation
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Storage battery unit
- Patent number 7,649,341
- Issue date Jan 19, 2010
- Shin-Kobe Electric Machinery Co., Ltd.
- Shun Kobuse
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device test method for comparing a first area with a...
- Patent number 7,550,982
- Issue date Jun 23, 2009
- Topcon Corporation
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 7,420,379
- Issue date Sep 2, 2008
- Topcon Corporation
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 7,385,195
- Issue date Jun 10, 2008
- Topcon Corporation
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 7,321,805
- Issue date Jan 22, 2008
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 7,232,994
- Issue date Jun 19, 2007
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 7,049,834
- Issue date May 23, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring apparatus and a method for measuring a thi...
- Patent number 7,002,361
- Issue date Feb 21, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 6,982,418
- Issue date Jan 3, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,975,125
- Issue date Dec 13, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 6,967,327
- Issue date Nov 22, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,946,857
- Issue date Sep 20, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 6,943,043
- Issue date Sep 13, 2005
- Fab Solutions, Inc.
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Contact hole standard test device, method of forming the same, meth...
- Patent number 6,940,296
- Issue date Sep 6, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 6,914,444
- Issue date Jul 5, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 6,900,645
- Issue date May 31, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Contact hole standard test device
- Patent number 6,897,440
- Issue date May 24, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring apparatus and a method for measuring a thi...
- Patent number 6,850,079
- Issue date Feb 1, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 6,842,663
- Issue date Jan 11, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing device
- Patent number 6,837,936
- Issue date Jan 4, 2005
- Fab Solutions, Inc.
- Takeo Ushiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device test method and semiconductor device tester
- Patent number 6,809,534
- Issue date Oct 26, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester which measures information related to a...
- Patent number 6,768,324
- Issue date Jul 27, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 6,753,194
- Issue date Jun 22, 2004
- Fab Solutions, Inc.
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 6,711,453
- Issue date Mar 23, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring thickness of thin film
- Patent number 6,683,308
- Issue date Jan 27, 2004
- Fab Solutions, Inc.
- Yosuke Itagaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Battery System
- Publication number 20170141589
- Publication date May 18, 2017
- HITACHI CHEMICAL COMPANY, LTD.
- Takeshi INOUE
- B60 - VEHICLES IN GENERAL
Information Patent Application
Direct-Current Power Source Apparatus
- Publication number 20110227540
- Publication date Sep 22, 2011
- SHIN-KOBE ELECTRIC MACHINERY CO., LTD.
- Mitsuyoshi KANOH
- B60 - VEHICLES IN GENERAL
Information Patent Application
BATTERY STATE DETERMINING APPARATUS
- Publication number 20090088994
- Publication date Apr 2, 2009
- SHIN-KOBE ELECTRIC MACHINERY CO., LTD.
- Yoshiaki Machiyama
- B60 - VEHICLES IN GENERAL
Information Patent Application
SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USE...
- Publication number 20090039274
- Publication date Feb 12, 2009
- TOPCON CORPORATION
- Takeo USHIKI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test method and semiconductor device tester
- Publication number 20080079447
- Publication date Apr 3, 2008
- TOPCON CORPORATION
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
STORAGE BATTERY UNIT
- Publication number 20070273329
- Publication date Nov 29, 2007
- SHIN-KOBE ELECTRIC MACHINERY CO., LTD.
- Shun Kobuse
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test method and semiconductor device tester
- Publication number 20060261824
- Publication date Nov 23, 2006
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device tester
- Publication number 20060202119
- Publication date Sep 14, 2006
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Contact hole standard test device, method of forming the same, meth...
- Publication number 20060093789
- Publication date May 4, 2006
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test method and semiconductor device tester
- Publication number 20050237069
- Publication date Oct 27, 2005
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Surface contamination analyzer for semiconductor wafers, method use...
- Publication number 20050230622
- Publication date Oct 20, 2005
- Takeo Ushiki
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING APPARATUS AND A METHOD FOR MEASURING A THI...
- Publication number 20050116726
- Publication date Jun 2, 2005
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Production managing system of semiconductor device
- Publication number 20050106803
- Publication date May 19, 2005
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact hole standard test device, method of forming the same, meth...
- Publication number 20040262517
- Publication date Dec 30, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device tester
- Publication number 20040239347
- Publication date Dec 2, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Contact hole standard test device, method of forming the same, meth...
- Publication number 20040232331
- Publication date Nov 25, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test method and semiconductor device tester
- Publication number 20040227531
- Publication date Nov 18, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test method and semiconductor device tester
- Publication number 20040222806
- Publication date Nov 11, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Contact hole standard test device, method of forming the same, meth...
- Publication number 20040212373
- Publication date Oct 28, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Surface contamination analyzer for semiconductor wafers, method use...
- Publication number 20040206903
- Publication date Oct 21, 2004
- Takeo Ushiki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device tester
- Publication number 20040207415
- Publication date Oct 21, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Production managing system of semiconductor device
- Publication number 20040167656
- Publication date Aug 26, 2004
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring thickness of thin film
- Publication number 20030132381
- Publication date Jul 17, 2003
- NEC Electronics Corporation
- Yosuke Itagaki
- G01 - MEASURING TESTING
Information Patent Application
Film thickness measuring apparatus and a method for measuring a thi...
- Publication number 20030132765
- Publication date Jul 17, 2003
- NEC Electronics Corporation
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Production managing system of semiconductor device
- Publication number 20020123818
- Publication date Sep 5, 2002
- NEC Corporation
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface contamination analyzer for semiconductor wafers, method use...
- Publication number 20020123161
- Publication date Sep 5, 2002
- Takeo Ushiki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor manufacturing device
- Publication number 20020118348
- Publication date Aug 29, 2002
- Takeo Ushiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device inspecting apparatus
- Publication number 20020070738
- Publication date Jun 13, 2002
- NEC Corporation
- Keizo Yamada
- G01 - MEASURING TESTING

Keizo Yamada

Person

Patents Grantslast 30 patents

Battery system

Direct-current power source apparatus

Battery state determining apparatus

Surface contamination analyzer for semiconductor wafers

Surface contamination analyzer for semiconductor wafers, method use...

Storage battery unit

Semiconductor device test method for comparing a first area with a...

Semiconductor device test method and semiconductor device tester

Semiconductor device tester

Production managing system of semiconductor device

Contact hole standard test device, method of forming the same, meth...

Semiconductor device test method and semiconductor device tester

Film thickness measuring apparatus and a method for measuring a thi...

Contact hole standard test device, method of forming the same, meth...

Semiconductor device tester

Contact hole standard test device, method of forming the same, meth...

Semiconductor device tester

Surface contamination analyzer for semiconductor wafers, method use...

Contact hole standard test device, method of forming the same, meth...

Semiconductor device test method and semiconductor device tester

Semiconductor device test method and semiconductor device tester

Contact hole standard test device

Film thickness measuring apparatus and a method for measuring a thi...

Production managing system of semiconductor device

Semiconductor manufacturing device

Semiconductor device test method and semiconductor device tester

Semiconductor device tester which measures information related to a...

Surface contamination analyzer for semiconductor wafers, method use...

Production managing system of semiconductor device

Method and apparatus for measuring thickness of thin film

Patents Applicationslast 30 patents

Battery System

Direct-Current Power Source Apparatus

BATTERY STATE DETERMINING APPARATUS

SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USE...

Semiconductor device test method and semiconductor device tester

STORAGE BATTERY UNIT

Semiconductor device test method and semiconductor device tester

Semiconductor device tester

Contact hole standard test device, method of forming the same, meth...

Semiconductor device test method and semiconductor device tester

Surface contamination analyzer for semiconductor wafers, method use...

FILM THICKNESS MEASURING APPARATUS AND A METHOD FOR MEASURING A THI...

Production managing system of semiconductor device

Contact hole standard test device, method of forming the same, meth...

Semiconductor device tester

Contact hole standard test device, method of forming the same, meth...

Semiconductor device test method and semiconductor device tester

Semiconductor device test method and semiconductor device tester

Contact hole standard test device, method of forming the same, meth...

Surface contamination analyzer for semiconductor wafers, method use...

Semiconductor device tester

Production managing system of semiconductor device

Method and apparatus for measuring thickness of thin film

Film thickness measuring apparatus and a method for measuring a thi...

Production managing system of semiconductor device

Surface contamination analyzer for semiconductor wafers, method use...

Semiconductor manufacturing device

Semiconductor device inspecting apparatus