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Keke WANG
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Shanghai, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Ion mobility analysis apparatus
Patent number
12,111,286
Issue date
Oct 8, 2024
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion guide device and ion guide method
Patent number
11,508,565
Issue date
Nov 22, 2022
Shimadzu Corporation
Keke Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion migration rate analysis device and analysis method applied
Patent number
11,164,735
Issue date
Nov 2, 2021
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
Kent James Gillig
G01 - MEASURING TESTING
Information
Patent Grant
Ion guiding device and guiding method
Patent number
11,031,224
Issue date
Jun 8, 2021
Shimadzu Corporation
Keke Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility analyzer and analysis method
Patent number
10,739,308
Issue date
Aug 11, 2020
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
Kent James Gillig
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION MOBILITY ANALYSIS APPARATUS
Publication number
20230417704
Publication date
Dec 28, 2023
Shimadzu Corporation
Xiaoqiang ZHANG
G01 - MEASURING TESTING
Information
Patent Application
ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY COMBINED ANALYSIS DEVICE
Publication number
20230046612
Publication date
Feb 16, 2023
Shimadzu Corporation
Wenjian SUN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY ANALYSIS APPARATUS
Publication number
20220341874
Publication date
Oct 27, 2022
Shimadzu Corporation
Xiaoqiang Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDE DEVICE AND ION GUIDE METHOD
Publication number
20220102128
Publication date
Mar 31, 2022
Shimadzu Corporation
Keke WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION GUIDING DEVICE AND GUIDING METHOD
Publication number
20200126777
Publication date
Apr 23, 2020
Shimadzu Corporation
Keke WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MIGRATION RATE ANALYSIS DEVICE AND ANALYSIS METHOD APPLIED
Publication number
20190164737
Publication date
May 30, 2019
SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
Kent James GILLIG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY ANALYZER AND ANALYSIS METHOD
Publication number
20190162698
Publication date
May 30, 2019
SHIMADZU RESEARCH LABORATORY(SHANGHAI) CO., LTD.
Kent James GILLIG
H01 - BASIC ELECTRIC ELEMENTS