Kele Shen

Follow

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method for scan testing three-dimensional chip
- Patent number 9,103,878
- Issue date Aug 11, 2015
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR SCAN TESTING THREE-DIMENSIONAL CHIP
- Publication number 20150074478
- Publication date Mar 12, 2015
- TSINGHUA UNIVERSITY
- Dong Xiang
- G01 - MEASURING TESTING