Kelly A. Ockunzzi

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Williston, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Bypass structure for a memory device and method to reduce unknown t...
- Patent number 8,917,566
- Issue date Dec 23, 2014
- International Business Machines Corporation
- Aaron J. Cummings
- G11 - INFORMATION STORAGE
Information Patent Grant
Mechanism to provide test access to third-party macro circuits embe...
- Patent number 7,734,968
- Issue date Jun 8, 2010
- International Business Machines Corporation
- Richard J. Grupp
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism to provide test access to third-party macro circuits embe...
- Patent number 7,308,630
- Issue date Dec 11, 2007
- International Business Machines Corporation
- Richard J. Grupp
- G01 - MEASURING TESTING
Information Patent Grant
Associated grouping of embedded cores for manufacturing test
- Patent number 6,882,159
- Issue date Apr 19, 2005
- International Business Machines Corporation
- Bruce Cowan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BYPASS STRUCTURE FOR A MEMORY DEVICE AND METHOD TO REDUCE UNKNOWN T...
- Publication number 20130272072
- Publication date Oct 17, 2013
- International Business Machines Corporation
- Aaron J. Cummings
- G11 - INFORMATION STORAGE
Information Patent Application
MECHANISM TO PROVIDE TEST ACCESS TO THIRD-PARTY MACRO CIRCUITS EMBE...
- Publication number 20080022171
- Publication date Jan 24, 2008
- Richard J. Grupp
- G01 - MEASURING TESTING
Information Patent Application
MECHANISM TO PROVIDE TEST ACCESS TO THIRD-PARTY MACRO CIRCUITS EMBE...
- Publication number 20060190782
- Publication date Aug 24, 2006
- International Business Machines Corporation
- Richard J. Grupp
- G01 - MEASURING TESTING