Kelly Barry

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,474,993
- Issue date Jan 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,216,045
- Issue date May 8, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20070198211
- Publication date Aug 23, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20030225535
- Publication date Dec 4, 2003
- Srinivas Doddi
- G01 - MEASURING TESTING