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Ken A. Ito
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San Jose, CA, US
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last 30 patents
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Patent Grant
Apparatus for a low-cost semiconductor test interface system
Patent number
8,786,301
Issue date
Jul 22, 2014
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
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Patent Grant
Apparatus for a low-cost semiconductor test interface system
Patent number
7,768,280
Issue date
Aug 3, 2010
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
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Patent Grant
Electronic circuit testing methods and apparatus
Patent number
6,195,772
Issue date
Feb 27, 2001
Altera Corporaiton
Bruce F. Mielke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
FLEXIBLE FEATURE ENABLING INTEGRATED CIRCUIT AND METHODS TO OPERATE...
Publication number
20170257369
Publication date
Sep 7, 2017
Ken A. Ito
G06 - COMPUTING CALCULATING COUNTING