Ken Cheong Cheah

Person

Penang, MY

People

Patents Grantslast 30 patents

Information Patent Grant
Input of test conditions and output generation for built-in self test
- Patent number 7,672,803
- Issue date Mar 2, 2010
- Spansion LLC
- Mimi Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Page—EXE erase algorithm for flash memory
- Patent number 7,415,646
- Issue date Aug 19, 2008
- Spansion LLC
- Mimi Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Automated tests for built-in self test
- Patent number 7,284,167
- Issue date Oct 16, 2007
- Spansion LLC
- Mimi Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible latency in flash memory
- Patent number 7,158,442
- Issue date Jan 2, 2007
- Spansion LLC
- Jih Hong Beh
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnostic mode for testing functionality of BIST (built-in-self-te...
- Patent number 7,028,240
- Issue date Apr 11, 2006
- Advanced Micro Devices, Inc.
- Edward V. Bautista, Jr.
- G11 - INFORMATION STORAGE
Information Patent Grant
Address sequencer within BIST (Built-in-Self-Test) system
- Patent number 7,010,736
- Issue date Mar 7, 2006
- Advanced Micro Devices, Inc.
- Boon Tang Teh
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and method
- Patent number 6,980,473
- Issue date Dec 27, 2005
- Advanced Micro Devices, Inc.
- Edward V. Bautista, Jr.
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and method
- Patent number 6,973,003
- Issue date Dec 6, 2005
- Advanced Micro Devices, Inc.
- Syahrizal Salleh
- G11 - INFORMATION STORAGE
Information Patent Grant
CAM (content addressable memory) cells as part of core array in fla...
- Patent number 6,970,368
- Issue date Nov 29, 2005
- Advanced Micro Devices, Inc.
- Edward V. Bautista, Jr.
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for erase voltage control during multiple sector...
- Patent number 6,891,752
- Issue date May 10, 2005
- Advanced Micro Devices
- Edward V. Bautista
- G11 - INFORMATION STORAGE
Information Patent Grant
Implementing reference current measurement mode within reference ar...
- Patent number 6,771,093
- Issue date Aug 3, 2004
- Advanced Micro Devices, Inc.
- Edward V. Bautista
- G01 - MEASURING TESTING
Information Patent Grant
Generation of margining voltage on-chip during testing CAM portion...
- Patent number 6,707,718
- Issue date Mar 16, 2004
- Advanced Micro Devices, Inc.
- Azrul Halim
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip erase pulse counter for efficient erase verify BIST (built-...
- Patent number 6,665,214
- Issue date Dec 16, 2003
- Advanced Micro Devices, Inc.
- Ken Cheong Cheah
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip repair of defective address of core flash memory cells
- Patent number 6,631,086
- Issue date Oct 7, 2003
- Advanced Micro Devices, Inc.
- Colin Bill
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Automated tests for built-in self test
- Publication number 20060168491
- Publication date Jul 27, 2006
- Spansion LLC
- Mimi Lee
- G11 - INFORMATION STORAGE
Information Patent Application
Built-in-self-test (BIST) of flash memory cells and implementation...
- Publication number 20040049724
- Publication date Mar 11, 2004
- Colin Bill
- G11 - INFORMATION STORAGE

Ken Cheong Cheah

Person

Patents Grantslast 30 patents

Input of test conditions and output generation for built-in self test

Page—EXE erase algorithm for flash memory

Automated tests for built-in self test

Flexible latency in flash memory

Diagnostic mode for testing functionality of BIST (built-in-self-te...

Address sequencer within BIST (Built-in-Self-Test) system

Memory device and method

Memory device and method

CAM (content addressable memory) cells as part of core array in fla...

System and method for erase voltage control during multiple sector...

Implementing reference current measurement mode within reference ar...

Generation of margining voltage on-chip during testing CAM portion...

On-chip erase pulse counter for efficient erase verify BIST (built-...

On-chip repair of defective address of core flash memory cells

Patents Applicationslast 30 patents

Automated tests for built-in self test

Built-in-self-test (BIST) of flash memory cells and implementation...