Ken Guillaume Lagarec

Person

Ottawa, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Method for cross-section sample preparation
- Patent number 12,007,344
- Issue date Jun 11, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,726,050
- Issue date Aug 15, 2023
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for iteratively cross-sectioning a sample to corr...
- Patent number 11,462,383
- Issue date Oct 4, 2022
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,366,074
- Issue date Jun 21, 2022
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number 10,886,100
- Issue date Jan 5, 2021
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopy imaging method and system
- Patent number 10,586,680
- Issue date Mar 10, 2020
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,915,628
- Issue date Mar 13, 2018
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method and system
- Patent number 9,812,290
- Issue date Nov 7, 2017
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method and system
- Patent number 9,633,819
- Issue date Apr 25, 2017
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method and system
- Patent number 9,601,309
- Issue date Mar 21, 2017
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,383,327
- Issue date Jul 5, 2016
- TECHINSIGHTS INC.
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 8,791,436
- Issue date Jul 29, 2014
- Chris Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for surface modification using charged particl...
- Patent number 8,552,406
- Issue date Oct 8, 2013
- Fibics Incorporated
- Michael William Phaneuf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods for performing circuit edit operations with low landing ene...
- Patent number 8,466,415
- Issue date Jun 18, 2013
- Fibics Incorporated
- Michael William Phaneuf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and system for counting secondary particles
- Patent number 8,093,567
- Issue date Jan 10, 2012
- Fibics Incorporated
- Ken Guillaume Lagarec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for focused ion beam data analysis
- Patent number 7,897,918
- Issue date Mar 1, 2011
- DCG Systems
- Michael William Phaneuf
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for surface modification using charged particl...
- Patent number 7,893,397
- Issue date Feb 22, 2011
- Fibics Incorporated
- Michael William Phaneuf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and system for identifying events in FIB
- Patent number 7,535,000
- Issue date May 19, 2009
- DCG Systems, Inc.
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20240177966
- Publication date May 30, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20230358696
- Publication date Nov 9, 2023
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20230044598
- Publication date Feb 9, 2023
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20220317072
- Publication date Oct 6, 2022
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20210159046
- Publication date May 27, 2021
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20200264115
- Publication date Aug 20, 2020
- Fibics Incorporated
- Michael William PHANEUF
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20200176218
- Publication date Jun 4, 2020
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20180053627
- Publication date Feb 22, 2018
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20170140897
- Publication date May 18, 2017
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160282287
- Publication date Sep 29, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20140319343
- Publication date Oct 30, 2014
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20140226003
- Publication date Aug 14, 2014
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDEPOSITION TECHNIQUE FOR MEMBRANE ATTACHMENT
- Publication number 20130001191
- Publication date Jan 3, 2013
- FIBICS INCORPORATED
- Ken Guillaume Lagarec
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODS FOR PERFORMING CIRCUIT EDIT OPERATIONS WITH LOW LANDING ENE...
- Publication number 20110204263
- Publication date Aug 25, 2011
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR SURFACE MODIFICATION USING CHARGED PARTICL...
- Publication number 20110186719
- Publication date Aug 4, 2011
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR COUNTING SECONDARY PARTICLES
- Publication number 20100084568
- Publication date Apr 8, 2010
- FIBICS INCORPORATED
- Ken Guillaume Lagarec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Focused Ion Beam Data Analysis
- Publication number 20090135240
- Publication date May 28, 2009
- Michael William Phaneuf
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Surface Modification Using Charged Particl...
- Publication number 20080302954
- Publication date Dec 11, 2008
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for identifying events in FIB
- Publication number 20080073580
- Publication date Mar 27, 2008
- Credence Systems Corporation
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS

Ken Guillaume Lagarec

Person

Patents Grantslast 30 patents

Method for cross-section sample preparation

Method and system for cross-sectioning a sample with a preset thick...

Microscopy imaging method for 3D tomography with predictive drift t...

Method for cross-section sample preparation

Method and system for iteratively cross-sectioning a sample to corr...

Method for cross-section sample preparation

Method and system for cross-sectioning a sample with a preset thick...

Microscopy imaging method and system

Circuit tracing using a focused ion beam

Microscopy imaging method and system

Microscopy imaging method and system

Microscopy imaging method and system

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Apparatus and method for surface modification using charged particl...

Methods for performing circuit edit operations with low landing ene...

Method and system for counting secondary particles

System and method for focused ion beam data analysis

Apparatus and method for surface modification using charged particl...

Method and system for identifying events in FIB

Patents Applicationslast 30 patents

MICROSCOPY IMAGING METHOD AND SYSTEM

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

MICROSCOPY IMAGING METHOD AND SYSTEM

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

MICROSCOPY IMAGING METHOD AND SYSTEM

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

MICROSCOPY IMAGING METHOD AND SYSTEM

MICROSCOPY IMAGING METHOD AND SYSTEM

MICROSCOPY IMAGING METHOD AND SYSTEM

CIRCUIT TRACING USING A FOCUSED ION BEAM

CIRCUIT TRACING USING A FOCUSED ION BEAM

MICROSCOPY IMAGING METHOD AND SYSTEM

REDEPOSITION TECHNIQUE FOR MEMBRANE ATTACHMENT

METHODS FOR PERFORMING CIRCUIT EDIT OPERATIONS WITH LOW LANDING ENE...

APPARATUS AND METHOD FOR SURFACE MODIFICATION USING CHARGED PARTICL...

METHOD AND SYSTEM FOR COUNTING SECONDARY PARTICLES

System and Method for Focused Ion Beam Data Analysis

Apparatus and Method for Surface Modification Using Charged Particl...

Method and system for identifying events in FIB