Ken HARADA

Person

Fukuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and sample observation method using the same
- Patent number 11,551,907
- Issue date Jan 10, 2023
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Cleaning liquid, cleaning method, and method for producing semicond...
- Patent number 11,149,231
- Issue date Oct 19, 2021
- MITSUBISHI CHEMICAL CORPORATION
- Ken Harada
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Cleaning agent composition for semiconductor device substrate, meth...
- Patent number 11,066,627
- Issue date Jul 20, 2021
- MITSUBISHI CHEMICAL CORPORATION
- Tomohiro Kusano
- B08 - CLEANING
Information Patent Grant
Holography reconstruction method and program
- Patent number 11,024,482
- Issue date Jun 1, 2021
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometric electron microscope
- Patent number 11,011,344
- Issue date May 18, 2021
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device, observation method, and diffraction grating
- Patent number 10,948,426
- Issue date Mar 16, 2021
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Interference optical system unit, charged particle beam interferenc...
- Patent number 10,770,264
- Issue date Sep 8, 2020
- Riken
- Yoh Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and imaging method
- Patent number 10,535,497
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, optical device, irradiation method, d...
- Patent number 10,210,962
- Issue date Feb 19, 2019
- HITACHI , LTD.
- Ken Harada
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Cleaning liquid for semiconductor device and method for cleaning su...
- Patent number 10,113,141
- Issue date Oct 30, 2018
- MITSUBISHI CHEMICAL CORPORATION
- Ken Harada
- B08 - CLEANING
Information Patent Grant
Zone plate having annular or spiral shape and Y-shaped branching ed...
- Patent number 9,864,114
- Issue date Jan 9, 2018
- Hitachi, Ltd.
- Ken Harada
- G02 - OPTICS
Information Patent Grant
Electron microscope
- Patent number 9,679,738
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Hiroaki Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleaning liquid for semiconductor device substrates and method of c...
- Patent number 9,365,802
- Issue date Jun 14, 2016
- MITSUBISHI CHEMICAL CORPORATION
- Ken Harada
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Electron beam interference device and electron beam interferometry
- Patent number 8,946,628
- Issue date Feb 3, 2015
- Hitachi, Ltd.
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Interference electron microscope
- Patent number 8,785,851
- Issue date Jul 22, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device including a first electron biprism to split an...
- Patent number 8,772,715
- Issue date Jul 8, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic field application system
- Patent number 8,653,472
- Issue date Feb 18, 2014
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method for observing specimen...
- Patent number 8,193,494
- Issue date Jun 5, 2012
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thick film resistor
- Patent number 7,999,652
- Issue date Aug 16, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam observation device using pre-specimen magnetic field...
- Patent number 7,939,801
- Issue date May 10, 2011
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 7,923,685
- Issue date Apr 12, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer
- Patent number 7,872,755
- Issue date Jan 18, 2011
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Electron interferometer or electron microscope
- Patent number 7,816,648
- Issue date Oct 19, 2010
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetization state control device and magnetic information recordi...
- Patent number 7,808,814
- Issue date Oct 5, 2010
- Riken
- Yoshihiko Togawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Interferometer having three electron biprisms
- Patent number 7,750,298
- Issue date Jul 6, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam equipment
- Patent number 7,655,905
- Issue date Feb 2, 2010
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 7,538,323
- Issue date May 26, 2009
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation system for applying external magnetic field
- Patent number 6,838,675
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING THE SAME
- Publication number 20210233741
- Publication date Jul 29, 2021
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ELECTRON MICROSCOPE
- Publication number 20200273657
- Publication date Aug 27, 2020
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING LIQUID, CLEANING METHOD, AND METHOD FOR PRODUCING SEMICOND...
- Publication number 20200231900
- Publication date Jul 23, 2020
- MITSUBISHI CHEMICAL CORPORATION
- Ken HARADA
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM
- Publication number 20200105498
- Publication date Apr 2, 2020
- Riken
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING AGENT COMPOSITION FOR SEMICONDUCTOR DEVICE SUBSTRATE, METH...
- Publication number 20200002652
- Publication date Jan 2, 2020
- MITSUBISHI CHEMICAL CORPORATION
- Tomohiro KUSANO
- B08 - CLEANING
Information Patent Application
INTERFERENCE OPTICAL SYSTEM UNIT, CHARGED PARTICLE BEAM INTERFERENC...
- Publication number 20190295816
- Publication date Sep 26, 2019
- Riken
- Yoh IWASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE, OBSERVATION METHOD, AND DIFFRACTION GRATING
- Publication number 20190196070
- Publication date Jun 27, 2019
- Riken
- Ken HARADA
- G02 - OPTICS
Information Patent Application
ELECTRON MICROSCOPE AND IMAGING METHOD
- Publication number 20190131107
- Publication date May 2, 2019
- Hitachi High-Technologies Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, OPTICAL DEVICE, IRRADIATION METHOD, D...
- Publication number 20170194065
- Publication date Jul 6, 2017
- Hitachi, Ltd
- Ken HARADA
- G02 - OPTICS
Information Patent Application
Electron Microscope
- Publication number 20160196952
- Publication date Jul 7, 2016
- HIitachi High-Technologies Corporation
- Hiroaki MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING LIQUID FOR SEMICONDUCTOR DEVICE AND METHOD FOR CLEANING SU...
- Publication number 20140371124
- Publication date Dec 18, 2014
- MITSUBISHI CHEMICAL CORPORATION
- Ken HARADA
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
Electron Beam Interference Device and Electron Beam Interferometry
- Publication number 20140332684
- Publication date Nov 13, 2014
- Hitachi, Ltd
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
ZONE PLATE
- Publication number 20140204463
- Publication date Jul 24, 2014
- Ken Harada
- G02 - OPTICS
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20140197312
- Publication date Jul 17, 2014
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE ELECTRON MICROSCOPE
- Publication number 20130313432
- Publication date Nov 28, 2013
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20130284925
- Publication date Oct 31, 2013
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING LIQUID FOR SEMICONDUCTOR DEVICE SUBSTRATES AND CLEANING ME...
- Publication number 20130225464
- Publication date Aug 29, 2013
- MITSUBISHI CHEMICAL CORPORATION
- Ken HARADA
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
CLEANING LIQUID FOR SEMICONDUCTOR DEVICE SUBSTRATES AND METHOD OF C...
- Publication number 20130174867
- Publication date Jul 11, 2013
- MITSUBISHI CHEMICAL CORPORATION
- Ken HARADA
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
Electron Beam Biprism Device and Electron Beam Device
- Publication number 20120241612
- Publication date Sep 27, 2012
- HITACHI LTD
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGENTIC FIELD APPLICATION SYSTEM
- Publication number 20110073759
- Publication date Mar 31, 2011
- Hitachi, Ltd.
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR OBSERVING SPECIMEN...
- Publication number 20110031395
- Publication date Feb 10, 2011
- Hitachi, Ltd.
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20090273789
- Publication date Nov 5, 2009
- Riken
- Ken Harada
- G02 - OPTICS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20090206256
- Publication date Aug 20, 2009
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM OBSERVATION DEVICE USING PRE-SPECIMEN MAGNETIC FIELD...
- Publication number 20090206258
- Publication date Aug 20, 2009
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THICK FILM RESISTOR
- Publication number 20090174523
- Publication date Jul 9, 2009
- Hitachi, Ltd.
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam equipment
- Publication number 20090045339
- Publication date Feb 19, 2009
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
Magnetization state control device and magnetic information recordi...
- Publication number 20090021866
- Publication date Jan 22, 2009
- Riken
- Yoshihiko Togawa
- G11 - INFORMATION STORAGE
Information Patent Application
Electron Interferometer or Electron Microscope
- Publication number 20080302965
- Publication date Dec 11, 2008
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interferometer
- Publication number 20080258058
- Publication date Oct 23, 2008
- Ken Harada
- G02 - OPTICS
Information Patent Application
Interferometer
- Publication number 20070272861
- Publication date Nov 29, 2007
- RIKEN
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Electron microscope and sample observation method using the same

Cleaning liquid, cleaning method, and method for producing semicond...

Cleaning agent composition for semiconductor device substrate, meth...

Holography reconstruction method and program

Interferometric electron microscope

Particle beam device, observation method, and diffraction grating

Interference optical system unit, charged particle beam interferenc...

Electron microscope and imaging method

Charged particle beam device, optical device, irradiation method, d...

Cleaning liquid for semiconductor device and method for cleaning su...

Zone plate having annular or spiral shape and Y-shaped branching ed...

Electron microscope

Cleaning liquid for semiconductor device substrates and method of c...

Electron beam interference device and electron beam interferometry

Interference electron microscope

Electron beam device including a first electron biprism to split an...

Electromagnetic field application system

Transmission electron microscope and method for observing specimen...

Thick film resistor

Electron beam observation device using pre-specimen magnetic field...

Electron beam device

Interferometer

Electron interferometer or electron microscope

Magnetization state control device and magnetic information recordi...

Interferometer having three electron biprisms

Charged particle beam equipment

Interferometer

Specimen observation system for applying external magnetic field

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING THE SAME

INTERFEROMETRIC ELECTRON MICROSCOPE

CLEANING LIQUID, CLEANING METHOD, AND METHOD FOR PRODUCING SEMICOND...

HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM

CLEANING AGENT COMPOSITION FOR SEMICONDUCTOR DEVICE SUBSTRATE, METH...

INTERFERENCE OPTICAL SYSTEM UNIT, CHARGED PARTICLE BEAM INTERFERENC...

PARTICLE BEAM DEVICE, OBSERVATION METHOD, AND DIFFRACTION GRATING

ELECTRON MICROSCOPE AND IMAGING METHOD

CHARGED PARTICLE BEAM DEVICE, OPTICAL DEVICE, IRRADIATION METHOD, D...

Electron Microscope

CLEANING LIQUID FOR SEMICONDUCTOR DEVICE AND METHOD FOR CLEANING SU...

Electron Beam Interference Device and Electron Beam Interferometry

ZONE PLATE

ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

INTERFERENCE ELECTRON MICROSCOPE

ELECTRON BEAM DEVICE

CLEANING LIQUID FOR SEMICONDUCTOR DEVICE SUBSTRATES AND CLEANING ME...

CLEANING LIQUID FOR SEMICONDUCTOR DEVICE SUBSTRATES AND METHOD OF C...

Electron Beam Biprism Device and Electron Beam Device

ELECTROMAGENTIC FIELD APPLICATION SYSTEM

TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR OBSERVING SPECIMEN...

Interferometer

ELECTRON BEAM DEVICE

ELECTRON BEAM OBSERVATION DEVICE USING PRE-SPECIMEN MAGNETIC FIELD...

THICK FILM RESISTOR

Charged particle beam equipment

Magnetization state control device and magnetic information recordi...

Electron Interferometer or Electron Microscope

Interferometer

Interferometer