Ken Hattori

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of quantitative determination of defect concentration on sur...
- Patent number 5,389,786
- Issue date Feb 14, 1995
- President of Nagoya University
- Noriaki Itoh
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing defect-free perfect surfaces
- Patent number 5,367,980
- Issue date Nov 29, 1994
- President of Nagoya University
- Noriaki Itom
- H01 - BASIC ELECTRIC ELEMENTS