Ken-ichi Hatakeyama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Bidimensional electromagnetic emission level monitoring equipment
- Patent number 5,300,879
- Issue date Apr 5, 1994
- NEC Corporation
- Norio Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic shielding member and electromagnetic shielding case
- Patent number 5,160,806
- Issue date Nov 3, 1992
- NEC Corporation
- Takashi Harada
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR