Ken-ichiro YOSHINO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Random number quality management method and apparatus
- Patent number 12,124,364
- Issue date Oct 22, 2024
- NEC Corporation
- Akio Tajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical sender and method for deciding modulation timing correctness
- Patent number 12,113,578
- Issue date Oct 8, 2024
- NEC Corporation
- Ken-ichiro Yoshino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Encryption key generation
- Patent number 11,909,647
- Issue date Feb 20, 2024
- NEC Corporation
- Takao Ochi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
3-dimensional measuring device
- Patent number 11,733,357
- Issue date Aug 22, 2023
- Topcon Corporation
- Yasushi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Optical modulation method and device using nested optical modulator
- Patent number 11,546,065
- Issue date Jan 3, 2023
- NEC Corporation
- Ken-ichiro Yoshino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surveying instrument
- Patent number 11,536,567
- Issue date Dec 27, 2022
- TOPCON Corporation
- Taichi Yuasa
- G01 - MEASURING TESTING
Information Patent Grant
3-dimensional measuring device
- Patent number 11,520,015
- Issue date Dec 6, 2022
- Topcon Corporation
- Yasushi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Transmitting device, receiving device, quantum key distribution met...
- Patent number 11,502,831
- Issue date Nov 15, 2022
- NEC Corporation
- Ken-ichiro Yoshino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Surveying instrument
- Patent number 11,435,457
- Issue date Sep 6, 2022
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Laser measuring method and laser measuring instrument
- Patent number 11,402,506
- Issue date Aug 2, 2022
- TOPCON Corporation
- Fumio Ohtomo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drive-timing adjustment method and device for a photon detector, an...
- Patent number 11,271,661
- Issue date Mar 8, 2022
- NEC Corporation
- Ken-ichiro Yoshino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement device, measurement method, and control program for mea...
- Patent number 11,181,639
- Issue date Nov 23, 2021
- Topcon Corporation
- Hideki Morita
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 11,143,505
- Issue date Oct 12, 2021
- TOPCON Corporation
- Kaoru Kumagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser scanner
- Patent number 10,935,636
- Issue date Mar 2, 2021
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanner system
- Patent number 10,823,563
- Issue date Nov 3, 2020
- TOPCON Corporation
- Ken-ichiro Yoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surveying system
- Patent number 10,816,665
- Issue date Oct 27, 2020
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Information communication system, information communication method...
- Patent number 10,735,328
- Issue date Aug 4, 2020
- NEC Corporation
- Takao Ochi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser scanner system and registration method of point cloud data
- Patent number 10,634,791
- Issue date Apr 28, 2020
- TOPCON Corporation
- Takahiro Komeichi
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanner system and registration method of point cloud data
- Patent number 10,488,196
- Issue date Nov 26, 2019
- TOPCON Corporation
- Takahiro Komeichi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 10,416,291
- Issue date Sep 17, 2019
- Topcon Corporation
- Hideki Morita
- G01 - MEASURING TESTING
Information Patent Grant
Optical receiver and control method thereof
- Patent number 9,989,407
- Issue date Jun 5, 2018
- NEC Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 9,921,062
- Issue date Mar 20, 2018
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Surveying instrument
- Patent number 9,909,871
- Issue date Mar 6, 2018
- TOPCON Corporation
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Laser light emitting device having a mode scrambler for unifying li...
- Patent number 9,709,676
- Issue date Jul 18, 2017
- Kabushiki Kaisha Topcon
- Taizo Eno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Projection apparatus, projection method, and projection program med...
- Patent number 9,667,930
- Issue date May 30, 2017
- Casio Computer Co., Ltd.
- Hideaki Inoue
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Display auxiliary device, display system, display method, and progr...
- Patent number 9,626,924
- Issue date Apr 18, 2017
- Casio Computer Co., Ltd.
- Kiyoshi Oda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical receiving device in optical communication system, control m...
- Patent number 9,584,319
- Issue date Feb 28, 2017
- NEC Corporation
- Ken-ichiro Yoshino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-dimensional measuring device and three-dimensional measuring...
- Patent number 9,243,897
- Issue date Jan 26, 2016
- Kabushiki Kaisha Topcon
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and recording medium
- Patent number 9,041,779
- Issue date May 26, 2015
- NEC Corporation
- Ken Yoshino
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser scanner and method for detecting mobile object
- Patent number 9,019,477
- Issue date Apr 28, 2015
- Kabushiki Kaisha Topcon
- Masae Matsumoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENCRYPTION KEY GENERATION
- Publication number 20240414088
- Publication date Dec 12, 2024
- NEC Corporation
- Takao OCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RECEPTION DEVICE, QUANTUM KEY DISTRIBUTION SYSTEM, AND METHOD FOR D...
- Publication number 20240405977
- Publication date Dec 5, 2024
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TERMINAL APPARATUS, MANAGEMENT APPARATUS, COMMUNICATION SYSTEM, COM...
- Publication number 20240313950
- Publication date Sep 19, 2024
- NEC Corporation
- Ken TANAKA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMMUNICATION DEVICE INCLUDING NESTED MODULATOR AND BIAS CONTROL ME...
- Publication number 20240129042
- Publication date Apr 18, 2024
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RECEPTION DEVICE, QUANTUM KEY DISTRIBUTION SYSTEM, AND METHOD FOR D...
- Publication number 20240089093
- Publication date Mar 14, 2024
- NEC Corporation
- Ken-ichiro YOSHINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTON DETECTION DEVICE, RECEPTION DEVICE, QUANTUM KEY DISTRIBUTION...
- Publication number 20240080184
- Publication date Mar 7, 2024
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL SENDER AND METHOD FOR DECIDING MODULATION TIMING CORRECTNESS
- Publication number 20230254045
- Publication date Aug 10, 2023
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
3-DIMENSIONAL MEASURING DEVICE
- Publication number 20230077077
- Publication date Mar 9, 2023
- TOPCON CORPORATION
- Yasushi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULATION METHOD AND DEVICE USING NESTED OPTICAL MODULATOR
- Publication number 20220182151
- Publication date Jun 9, 2022
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RANDOM NUMBER SUPPLY METHOD AND DEVICE
- Publication number 20220043633
- Publication date Feb 10, 2022
- NEC Corporation
- Ken-ichiro YOSHINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRIVE-TIMING ADJUSTMENT METHOD AND DEVICE FOR A PHOTON DETECTOR, AN...
- Publication number 20210021352
- Publication date Jan 21, 2021
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ENCRYPTION KEY GENERATION
- Publication number 20200344170
- Publication date Oct 29, 2020
- NEC Corporation
- Takao OCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Surveying Instrument
- Publication number 20200041626
- Publication date Feb 6, 2020
- TOPCON CORPORATION
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Application
Laser Scanner System
- Publication number 20200041268
- Publication date Feb 6, 2020
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Application
TRANSMITTING DEVICE, RECEIVING DEVICE, QUANTUM KEY DISTRIBUTION MET...
- Publication number 20190245685
- Publication date Aug 8, 2019
- NEC Corporation
- Ken-ichiro YOSHINO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20190227171
- Publication date Jul 25, 2019
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
Surveying Instrument
- Publication number 20190162853
- Publication date May 30, 2019
- TOPCON Corporation
- Kaoru Kumagai
- G01 - MEASURING TESTING
Information Patent Application
Laser Measuring Method And Laser Measuring Instrument
- Publication number 20190094363
- Publication date Mar 28, 2019
- TOPCON CORPORATION
- Fumio Ohtomo
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
Surveying Instrument
- Publication number 20190078883
- Publication date Mar 14, 2019
- TOPCON Corporation
- Taichi Yuasa
- G01 - MEASURING TESTING
Information Patent Application
3-DIMENSIONAL MEASURING DEVICE
- Publication number 20190064326
- Publication date Feb 28, 2019
- TOPCON CORPORATION
- Yasushi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Laser Scanner
- Publication number 20180292514
- Publication date Oct 11, 2018
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT METHOD, AND CONTROL PROGRAM FOR MEA...
- Publication number 20180284281
- Publication date Oct 4, 2018
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20180284238
- Publication date Oct 4, 2018
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
Surveying System
- Publication number 20180224549
- Publication date Aug 9, 2018
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20180088213
- Publication date Mar 29, 2018
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
Laser Scanner System And Registration Method Of Point Cloud Data
- Publication number 20180087901
- Publication date Mar 29, 2018
- TOPCON Corporation
- Takahiro Komeichi
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20180074197
- Publication date Mar 15, 2018
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
Laser Scanner System And Registration Method Of Point Cloud Data
- Publication number 20180003825
- Publication date Jan 4, 2018
- TOPCON Corporation
- Takahiro Komeichi
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION COMMUNICATION SYSTEM, INFORMATION COMMUNICATION METHOD...
- Publication number 20170237666
- Publication date Aug 17, 2017
- NEC Corporation
- Takao OCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Surveying Instrument
- Publication number 20160349050
- Publication date Dec 1, 2016
- TOPCON Corporation
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING

Ken-ichiro YOSHINO

Person

Patents Grantslast 30 patents

Random number quality management method and apparatus

Optical sender and method for deciding modulation timing correctness

Encryption key generation

3-dimensional measuring device

Optical modulation method and device using nested optical modulator

Surveying instrument

3-dimensional measuring device

Transmitting device, receiving device, quantum key distribution met...

Surveying instrument

Laser measuring method and laser measuring instrument

Drive-timing adjustment method and device for a photon detector, an...

Measurement device, measurement method, and control program for mea...

Surveying instrument

Laser scanner

Laser scanner system

Surveying system

Information communication system, information communication method...

Laser scanner system and registration method of point cloud data

Laser scanner system and registration method of point cloud data

Three-dimensional measurement device

Optical receiver and control method thereof

Surveying instrument

Surveying instrument

Laser light emitting device having a mode scrambler for unifying li...

Projection apparatus, projection method, and projection program med...

Display auxiliary device, display system, display method, and progr...

Optical receiving device in optical communication system, control m...

Three-dimensional measuring device and three-dimensional measuring...

Electronic device and recording medium

Laser scanner and method for detecting mobile object

Patents Applicationslast 30 patents

ENCRYPTION KEY GENERATION

RECEPTION DEVICE, QUANTUM KEY DISTRIBUTION SYSTEM, AND METHOD FOR D...

TERMINAL APPARATUS, MANAGEMENT APPARATUS, COMMUNICATION SYSTEM, COM...

COMMUNICATION DEVICE INCLUDING NESTED MODULATOR AND BIAS CONTROL ME...

RECEPTION DEVICE, QUANTUM KEY DISTRIBUTION SYSTEM, AND METHOD FOR D...

PHOTON DETECTION DEVICE, RECEPTION DEVICE, QUANTUM KEY DISTRIBUTION...

OPTICAL SENDER AND METHOD FOR DECIDING MODULATION TIMING CORRECTNESS

3-DIMENSIONAL MEASURING DEVICE

OPTICAL MODULATION METHOD AND DEVICE USING NESTED OPTICAL MODULATOR

RANDOM NUMBER SUPPLY METHOD AND DEVICE

DRIVE-TIMING ADJUSTMENT METHOD AND DEVICE FOR A PHOTON DETECTOR, AN...

ENCRYPTION KEY GENERATION

Surveying Instrument

Laser Scanner System

TRANSMITTING DEVICE, RECEIVING DEVICE, QUANTUM KEY DISTRIBUTION MET...

DISTANCE MEASURING DEVICE

Surveying Instrument

Laser Measuring Method And Laser Measuring Instrument

Surveying Instrument

3-DIMENSIONAL MEASURING DEVICE

Laser Scanner

MEASUREMENT DEVICE, MEASUREMENT METHOD, AND CONTROL PROGRAM FOR MEA...

THREE-DIMENSIONAL MEASUREMENT DEVICE

Surveying System

DISTANCE MEASURING DEVICE

Laser Scanner System And Registration Method Of Point Cloud Data

DISTANCE MEASURING DEVICE

Laser Scanner System And Registration Method Of Point Cloud Data

INFORMATION COMMUNICATION SYSTEM, INFORMATION COMMUNICATION METHOD...

Surveying Instrument