Ken Iizumi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Data processing device, semiconductor external view inspection devi...
- Patent number 9,489,324
- Issue date Nov 8, 2016
- Hitachi High-Technologies Corporation
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DATA PROCESSING DEVICE, SEMICONDUCTOR EXTERNAL VIEW INSPECTION DEVI...
- Publication number 20140372656
- Publication date Dec 18, 2014
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Inspecting Apparatus
- Publication number 20130136334
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Yuichi Sakurai
- G01 - MEASURING TESTING
Information Patent Application
Measurement method of electron beam current, electron beam lithogra...
- Publication number 20060011869
- Publication date Jan 19, 2006
- Noriyuki Tanaka
- B82 - NANO-TECHNOLOGY