Ken Lee

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 10,209,501
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement of opening dimensions in a wafer
- Patent number 10,157,457
- Issue date Dec 18, 2018
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,048,480
- Issue date Aug 14, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,664,888
- Issue date May 30, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,645,381
- Issue date May 9, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 9,389,408
- Issue date Jul 12, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,036,869
- Issue date May 19, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
System and method for monitoring LED chip surface roughening process
- Patent number 8,976,366
- Issue date Mar 10, 2015
- Zeta Instruments, Inc.
- James Jianguo Xu
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator for a 3-D optical microscope
- Patent number 8,184,364
- Issue date May 22, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3-D optical microscope
- Patent number 8,174,762
- Issue date May 8, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
3-D optical microscope
- Patent number 7,944,609
- Issue date May 17, 2011
- Zeta Instruments, Inc.
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
3-d optical microscope
- Patent number 7,729,049
- Issue date Jun 1, 2010
- Zeta Instruments, Inc.
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Replicating data across the nodes in a cluster environment
- Patent number 7,693,882
- Issue date Apr 6, 2010
- Oracle International Corporation
- Ken Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Providing the latest version of a data item from an N-replica set
- Patent number 7,631,016
- Issue date Dec 8, 2009
- Oracle International Corporation
- Ken Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting and correcting node misconfiguration of information about...
- Patent number 7,437,426
- Issue date Oct 14, 2008
- Oracle International Corporation
- Sameer Joshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect review system with 2D scanning and a ring detector
- Patent number 7,433,031
- Issue date Oct 7, 2008
- Core Tech Optical, Inc.
- James J. Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 7,384,806
- Issue date Jun 10, 2008
- KLA-Tencor Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 7,154,605
- Issue date Dec 26, 2006
- KLA-Tencor Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection system
- Patent number 7,110,106
- Issue date Sep 19, 2006
- CoreTech Optical, Inc.
- James J. Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 6,661,515
- Issue date Dec 9, 2003
- KLA-Tencor Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 6,288,782
- Issue date Sep 11, 2001
- Ultrapointe Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated laser imaging and spectral analysis system
- Patent number 6,069,690
- Issue date May 30, 2000
- Uniphase Corporation
- James J. Xu
- G01 - MEASURING TESTING
Information Patent Grant
Laser imaging system for inspection and analysis of sub-micron part...
- Patent number 5,963,314
- Issue date Oct 5, 1999
- Ultrapointe Corporation
- Bruce W. Worster
- G02 - OPTICS
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 5,923,430
- Issue date Jul 13, 1999
- Ultrapointe Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 5,808,735
- Issue date Sep 15, 1998
- Ultrapointe Corporation
- Ken K. Lee
- G02 - OPTICS
Information Patent Grant
Method and apparatus for automatically focusing a microscope
- Patent number 5,783,814
- Issue date Jul 21, 1998
- Ultrapointe Corporation
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Grant
Aperture optimization method providing improved defect detection an...
- Patent number 5,761,336
- Issue date Jun 2, 1998
- Ultrapointe Corporation
- James J. Xu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for automatic focusing of a confocal laser mic...
- Patent number 5,672,861
- Issue date Sep 30, 1997
- Ultrapointe Corporation
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Grant
Automated surface acquisition for a confocal microscope
- Patent number 5,594,235
- Issue date Jan 14, 1997
- Ultrapointe Corporation
- Ken K. Lee
- G02 - OPTICS
Information Patent Grant
Method and apparatus for performing an automatic focus operation fo...
- Patent number 5,483,055
- Issue date Jan 9, 1996
- Timothy V. Thompson
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20180356623
- Publication date Dec 13, 2018
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER
- Publication number 20180047148
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160253813
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160252714
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226952
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226953
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
System And Method For Monitoring LED Chip Surface Roughening Process
- Publication number 20120327414
- Publication date Dec 27, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20120176475
- Publication date Jul 12, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20120051660
- Publication date Mar 1, 2012
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20120019626
- Publication date Jan 26, 2012
- Zeta Instruments, Inc.
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3-D Optical Microscope
- Publication number 20100134595
- Publication date Jun 3, 2010
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
3-D Optical Microscope
- Publication number 20100135573
- Publication date Jun 3, 2010
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
3-D OPTICAL MICROSCOPE
- Publication number 20080291532
- Publication date Nov 27, 2008
- James Jianguo Xu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ILLUMINATOR FOR A 3-D OPTICAL MICROSCOPE
- Publication number 20080291533
- Publication date Nov 27, 2008
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
Method for Characterizing Defects on Semiconductor Wafers
- Publication number 20070104357
- Publication date May 10, 2007
- KLA-Tencor Corporation
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Replicating data across the nodes in a cluster environment
- Publication number 20070078911
- Publication date Apr 5, 2007
- Ken Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting and correcting node misconfiguration of information about...
- Publication number 20070073855
- Publication date Mar 29, 2007
- Sameer Joshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Providing the latest version of a data item from an N-replica set
- Publication number 20060253504
- Publication date Nov 9, 2006
- Ken Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for managing objects in a server namespace
- Publication number 20060136434
- Publication date Jun 22, 2006
- Susan Lynn Campbell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Surface inspection method
- Publication number 20050105791
- Publication date May 19, 2005
- Ken K. Lee
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection system
- Publication number 20050094864
- Publication date May 5, 2005
- James J. Xu
- G01 - MEASURING TESTING
Information Patent Application
Defect review system and method
- Publication number 20050094136
- Publication date May 5, 2005
- James J. Xu
- G01 - MEASURING TESTING
Information Patent Application
Method for characterizing defects on semiconductor wafers
- Publication number 20030203520
- Publication date Oct 30, 2003
- Bruce W. Worster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for characterizing defects on semiconductor wafers
- Publication number 20020012118
- Publication date Jan 31, 2002
- Bruce W. Worster
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

3D microscope and methods of measuring patterned substrates

Optical measurement of opening dimensions in a wafer

3D microscope including insertable components to provide multiple i...

Multi-surface optical 3D microscope

Multi-surface optical 3D microscope

3D microscope and methods of measuring patterned substrates

Multi-surface optical 3D microscope

System and method for monitoring LED chip surface roughening process

Illuminator for a 3-D optical microscope

3-D optical microscope

3-D optical microscope

3-d optical microscope

Replicating data across the nodes in a cluster environment

Providing the latest version of a data item from an N-replica set

Detecting and correcting node misconfiguration of information about...

Defect review system with 2D scanning and a ring detector

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers

Surface inspection system

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers

Integrated laser imaging and spectral analysis system

Laser imaging system for inspection and analysis of sub-micron part...

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers

Method and apparatus for automatically focusing a microscope

Aperture optimization method providing improved defect detection an...

Method and apparatus for automatic focusing of a confocal laser mic...

Automated surface acquisition for a confocal microscope

Method and apparatus for performing an automatic focus operation fo...

Patents Applicationslast 30 patents

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER

3D Microscope And Methods Of Measuring Patterned Substrates

3D Microscope And Methods Of Measuring Patterned Substrates

Multi-Surface Optical 3D Microscope

Multi-Surface Optical 3D Microscope

System And Method For Monitoring LED Chip Surface Roughening Process

3D Microscope Including Insertable Components To Provide Multiple I...

Multi-Surface Optical 3D Microscope

3D Microscope And Methods Of Measuring Patterned Substrates

3-D Optical Microscope

3-D Optical Microscope

3-D OPTICAL MICROSCOPE

ILLUMINATOR FOR A 3-D OPTICAL MICROSCOPE

Method for Characterizing Defects on Semiconductor Wafers

Replicating data across the nodes in a cluster environment

Detecting and correcting node misconfiguration of information about...

Providing the latest version of a data item from an N-replica set

System and method for managing objects in a server namespace

Surface inspection method

Surface inspection system

Defect review system and method

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers