Ken MOTOHASHI

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Optical interference measuring device
- Patent number 10,794,688
- Issue date Oct 6, 2020
- Mitutoyo Corporation
- Ken Motohashi
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 10,295,337
- Issue date May 21, 2019
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus and method
- Patent number 10,161,747
- Issue date Dec 25, 2018
- Mitutoyo Corporation
- Hiroshi Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Interference measuring device and method of measurement using the s...
- Patent number 10,024,648
- Issue date Jul 17, 2018
- Mitutoyo Corporation
- Tatsuya Nagahama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INTERFERENCE MEASURING DEVICE
- Publication number 20190277628
- Publication date Sep 12, 2019
- MITUTOYO CORPORATION
- Ken MOTOHASHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE MEASURING DEVICE AND METHOD OF MEASUREMENT USING THE S...
- Publication number 20170363411
- Publication date Dec 21, 2017
- Mitutoyo Corporation
- Tatsuya Nagahama
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING APPARATUS AND METHOD
- Publication number 20170248416
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Hiroshi SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING APPARATUS
- Publication number 20170248415
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Sadayuki MATSUMIYA
- G01 - MEASURING TESTING