Ken Murayama

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe manufacturing method, probe, and scanning probe microscope
- Patent number 7,388,199
- Issue date Jun 17, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning type probe microscope and probe moving control method ther...
- Patent number 7,350,404
- Issue date Apr 1, 2008
- Hitachi Kenki Fine Tech Co., Ltd.
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using the same
- Patent number 7,333,191
- Issue date Feb 19, 2008
- Hitachi Kenki FineTech. Co., Ltd.
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,745,617
- Issue date Jun 8, 2004
- Hitachi Kenki FineTech. Co., Ltd.
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,278,113
- Issue date Aug 21, 2001
- Hitachi Construction Machinery Co, Ltd.
- Ken Murayama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine movement mechanism unit and scanning probe microscope
- Patent number 6,229,607
- Issue date May 8, 2001
- Hitachi Construction Machinery Co., Ltd.
- Takashi Shirai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope with the stage unit
- Patent number 6,184,533
- Issue date Feb 6, 2001
- Hitachi Construction Machinery Co., Ltd.
- Takashi Shirai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and processing apparatus
- Patent number 5,965,881
- Issue date Oct 12, 1999
- Hitachi Construction Machinery Co., Ltd.
- Takafumi Morimoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Displacement controller for fine positioning device
- Patent number 5,005,298
- Issue date Apr 9, 1991
- Hitachi Construction Machinery Co., Ltd.
- Kiyoshi Nagasawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fine positioning device and displacement controller therefor
- Patent number 4,991,309
- Issue date Feb 12, 1991
- Hitachi Construction Machinery Co., Ltd.
- Kiyoshi Nagasawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fine positioning device and displacement controller therefor
- Patent number 4,920,660
- Issue date May 1, 1990
- Hitachi Construction Machinery Co., Ltd.
- Kiyoshi Nagasawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fine positioning device
- Patent number 4,888,878
- Issue date Dec 26, 1989
- Hitachi Construction Machinery Co., Ltd.
- Kiyoshi Nagasawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASURING METHOD THEREBY
- Publication number 20090140142
- Publication date Jun 4, 2009
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Application
Probe replacement method for scanning probe microscope
- Publication number 20070180889
- Publication date Aug 9, 2007
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning type probe microscope and probe moving control method ther...
- Publication number 20060284083
- Publication date Dec 21, 2006
- Tooru Kurenuma
- G01 - MEASURING TESTING
Information Patent Application
Probe manufacturing method, probe, and scanning probe microsope
- Publication number 20060284084
- Publication date Dec 21, 2006
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and measurement method using the same
- Publication number 20050012936
- Publication date Jan 20, 2005
- Ken Murayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20020089339
- Publication date Jul 11, 2002
- Ken Murayama
- B82 - NANO-TECHNOLOGY

Ken Murayama

Person

Patents Grantslast 30 patents

Probe manufacturing method, probe, and scanning probe microscope

Scanning type probe microscope and probe moving control method ther...

Scanning probe microscope and measurement method using the same

Scanning probe microscope

Scanning probe microscope

Fine movement mechanism unit and scanning probe microscope

Scanning probe microscope with the stage unit

Scanning probe microscope and processing apparatus

Displacement controller for fine positioning device

Fine positioning device and displacement controller therefor

Fine positioning device and displacement controller therefor

Fine positioning device

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE AND MEASURING METHOD THEREBY

Probe replacement method for scanning probe microscope

Scanning type probe microscope and probe moving control method ther...

Probe manufacturing method, probe, and scanning probe microsope

Scanning probe microscope and measurement method using the same

Scanning probe microscope