Ken Onoe

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Position detector

    • Patent number 7,743,527
    • Issue date Jun 29, 2010
    • Mori Seiki Co., Ltd
    • Ken Onoe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic flux measuring device

    • Patent number 6,788,053
    • Issue date Sep 7, 2004
    • Sony Precision Technology Inc.
    • Yasuo Nekado
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electromagnetic clutch

    • Patent number 6,668,996
    • Issue date Dec 30, 2003
    • Sony Precision Technology Inc.
    • Yasuo Nekado
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Scale device

    • Patent number 6,119,357
    • Issue date Sep 19, 2000
    • Sony Precision Technology, Inc.
    • Osamu Ochiai
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    POSITION DETECTOR

    • Publication number 20090106997
    • Publication date Apr 30, 2009
    • SONY CORPORATION
    • Ken Onoe
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electromagnetic clutch

    • Publication number 20030019711
    • Publication date Jan 30, 2003
    • Yasuo Nekado
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Application

    Magnetic flux measuring device

    • Publication number 20030006765
    • Publication date Jan 9, 2003
    • Sony Precision Technology Inc.
    • Yasuo Nekado
    • G01 - MEASURING TESTING