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Ken Onoe
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Position detector
Patent number
7,743,527
Issue date
Jun 29, 2010
Mori Seiki Co., Ltd
Ken Onoe
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic flux measuring device
Patent number
6,788,053
Issue date
Sep 7, 2004
Sony Precision Technology Inc.
Yasuo Nekado
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic clutch
Patent number
6,668,996
Issue date
Dec 30, 2003
Sony Precision Technology Inc.
Yasuo Nekado
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Scale device
Patent number
6,119,357
Issue date
Sep 19, 2000
Sony Precision Technology, Inc.
Osamu Ochiai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POSITION DETECTOR
Publication number
20090106997
Publication date
Apr 30, 2009
SONY CORPORATION
Ken Onoe
G01 - MEASURING TESTING
Information
Patent Application
Electromagnetic clutch
Publication number
20030019711
Publication date
Jan 30, 2003
Yasuo Nekado
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
Magnetic flux measuring device
Publication number
20030006765
Publication date
Jan 9, 2003
Sony Precision Technology Inc.
Yasuo Nekado
G01 - MEASURING TESTING