TREA

Ken Taoka

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  • Nirasaki, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe device
    • Patent number 9,759,762
    • Issue date Sep 12, 2017
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus
    • Patent number 9,658,285
    • Issue date May 23, 2017
    • Tokyo Electron Limited
    • Isao Kouno
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus
    • Patent number 9,347,970
    • Issue date May 24, 2016
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card for power device
    • Patent number 9,322,844
    • Issue date Apr 26, 2016
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE DEVICE
    • Publication number 20160061882
    • Publication date Mar 3, 2016
    • TOKYO ELECTRON LIMITED
    • Eiichi SHINOHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20140247037
    • Publication date Sep 4, 2014
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD FOR POWER DEVICE
    • Publication number 20140176173
    • Publication date Jun 26, 2014
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20130063171
    • Publication date Mar 14, 2013
    • TOKYO ELECTRON LIMITED
    • Isao Kouno
    • G01 - MEASURING TESTING