Keng-Li SU

Person

Zhubei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Heat dissipatable die unit and probe seat using the same
- Patent number 12,050,235
- Issue date Jul 30, 2024
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Die plate assembly for probe head
- Patent number D1031738
- Issue date Jun 18, 2024
- MPI Corporation
- Chin-Yi Lin
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Probe head and probe card
- Patent number 11,733,267
- Issue date Aug 22, 2023
- MPI CORPORATION
- Che-Wei Lin
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and die set having horizontally fine adjustable die and...
- Patent number 11,619,656
- Issue date Apr 4, 2023
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Through silicon via repair circuit of semiconductor apparatus
- Patent number 9,219,479
- Issue date Dec 22, 2015
- Industrial Technology Research Institute
- Pei-Ling Tseng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Through silicon via repair circuit of semiconductor device
- Patent number 9,136,843
- Issue date Sep 15, 2015
- Industrial Technology Research Institute
- Pei-Ling Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Through silicon via repair circuit
- Patent number 9,136,250
- Issue date Sep 15, 2015
- Industrial Technology Research Institute
- Pei-Ling Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring method for three-dimensional intergrated circuit (3D IC)...
- Patent number 9,064,837
- Issue date Jun 23, 2015
- Industrial Technology Research Institute
- Keng-Li Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through silicon via bidirectional repair circuit of semiconductor a...
- Patent number 9,059,586
- Issue date Jun 16, 2015
- Industrial Technology Research Institute
- Pei-Ling Tseng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Multi-chip stack structure
- Patent number 8,581,419
- Issue date Nov 12, 2013
- Industrial Technology Research Institute
- Keng-Li Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring method for through-silicon vias of three-dimensional int...
- Patent number 8,219,340
- Issue date Jul 10, 2012
- Industrial Technology Research Institute
- Keng-Li Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge structure for 3-dimensional integrated circ...
- Patent number 8,164,113
- Issue date Apr 24, 2012
- Industrial Technology Research Institute
- Chih-Sheng Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memories with improved write current
- Patent number 7,894,274
- Issue date Feb 22, 2011
- Industrial Technology Research Institute
- Chih Sheng Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory accessing circuit and method
- Patent number 7,738,289
- Issue date Jun 15, 2010
- Industrial Technology Research Institute
- Min Chuan Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory and multi-state sense amplifier thereof
- Patent number 7,539,068
- Issue date May 26, 2009
- Industrial Technology Research Institute
- Min-Chuan Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory structure and data writing method thereof
- Patent number 7,508,727
- Issue date Mar 24, 2009
- Industrial Technology Research Institute
- Keng-Li Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-state sense amplifier
- Patent number 7,486,546
- Issue date Feb 3, 2009
- Industrial Technology Research Institute
- Min-Chuan Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for monitoring oxide film deposition
- Patent number 7,407,820
- Issue date Aug 5, 2008
- Macronix International Co., Ltd.
- Mao-Chan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sense amplifier
- Patent number 7,394,295
- Issue date Jul 1, 2008
- Industrial Technology Research Institute
- Chia-Pao Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable memory cell and operation method
- Patent number 7,369,424
- Issue date May 6, 2008
- Industrial Technology Research Institute
- Keng-Li Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of forming a silicon nitride layer
- Patent number 7,229,502
- Issue date Jun 12, 2007
- Macronix International Co., Ltd.
- Ching-Tang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broadband single-ended input upconverter
- Patent number 7,123,899
- Issue date Oct 17, 2006
- Industrial Technology Research Institute
- Yung-Hue Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power controller
- Patent number 6,980,780
- Issue date Dec 27, 2005
- Media Tek Inc.
- Chieh-Sheng Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
RF power amplifier with high efficiency and a wide range of gain co...
- Patent number 5,942,946
- Issue date Aug 24, 1999
- Industrial Technology Research Institute
- Keng-Li Su
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...
- Publication number 20220214379
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
HEAT DISSIPATABLE DIE UNIT AND PROBE SEAT USING THE SAME
- Publication number 20220214380
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE CARD
- Publication number 20200309819
- Publication date Oct 1, 2020
- MPI Corporation
- Che-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
THROUGH SILICON VIA REPAIR CIRCUIT OF SEMICONDUCTOR DEVICE
- Publication number 20140340113
- Publication date Nov 20, 2014
- Pei-Ling TSENG
- G01 - MEASURING TESTING
Information Patent Application
TENSILE POLYCRYSTALLINE SILICON FILM HAVING STABLE RESISTIVITY AND...
- Publication number 20140225115
- Publication date Aug 14, 2014
- MACRONIX INTERNATIONAL CO., LTD.
- Kuang-Hui Tai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH SILICON VIA REPAIR CIRCUIT
- Publication number 20140184322
- Publication date Jul 3, 2014
- Industrial Technology Research Institute
- Pei-Ling Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Voltage-Controlled Oscillator Circuit Structure
- Publication number 20140184346
- Publication date Jul 3, 2014
- Sih-Han LI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THROUGH SILICON VIA BIDIRECTIONAL REPAIR CIRCUIT OF SEMICONDUCTOR A...
- Publication number 20140185174
- Publication date Jul 3, 2014
- Industrial Technology Research Institute
- Pei-Ling Tseng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
THROUGH SILICON VIA REPAIR CIRCUIT OF SEMICONDUCTOR APPARATUS
- Publication number 20140145753
- Publication date May 29, 2014
- Industrial Technology Research Institute
- Pei-Ling Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING METHOD FOR THREE-DIMENSIONAL INTERGRATED CIRCUIT (3D IC)...
- Publication number 20120249178
- Publication date Oct 4, 2012
- Industrial Technology Research Institute
- Keng-Li SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-CHIP STACK STRUCTURE
- Publication number 20120139092
- Publication date Jun 7, 2012
- Industrial Technology Research Institute
- Keng-Li Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR TESTING THROUGH-SILICON VIA (TSV)
- Publication number 20120018723
- Publication date Jan 26, 2012
- Keng-Li SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE STRUCTURE FOR 3-DIMENSIONAL INTEGRATED CIRC...
- Publication number 20100237386
- Publication date Sep 23, 2010
- Industrial Technology Research Institute
- Chih Sheng LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING METHOD FOR THROUGH-SILICON VIAS OF THREE-DIMENSIONAL INT...
- Publication number 20100153043
- Publication date Jun 17, 2010
- Industrial Technology Research Institute
- Keng-Li SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORIES WITH IMPROVED WRITE CURRENT
- Publication number 20100118617
- Publication date May 13, 2010
- Industrial Technology Research Institute
- Chih Sheng Lin
- G11 - INFORMATION STORAGE
Information Patent Application
Memory accessing circuit and method
- Publication number 20090141574
- Publication date Jun 4, 2009
- Industrial Technology Research Institute
- Min Chuan Wang
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE DRIVING CIRCUIT
- Publication number 20080157826
- Publication date Jul 3, 2008
- Industrial Technology Research Institute
- Ming-Daw Chen
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Memory and multi-state sense amplifier thereof
- Publication number 20080019192
- Publication date Jan 24, 2008
- INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Min-Chuan Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-state sense amplifier
- Publication number 20080007992
- Publication date Jan 10, 2008
- INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Min-Chuan Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Sense amplifier
- Publication number 20070170956
- Publication date Jul 26, 2007
- INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Keng-Li Su
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMORY STRUCTURE AND DATA WRITING METHOD THEREOF
- Publication number 20070153567
- Publication date Jul 5, 2007
- Keng-Li Su
- G11 - INFORMATION STORAGE
Information Patent Application
Programmable memory cell and operation method
- Publication number 20070103962
- Publication date May 10, 2007
- Keng-Li Su
- G11 - INFORMATION STORAGE
Information Patent Application
Thin-film transistor
- Publication number 20060243974
- Publication date Nov 2, 2006
- Keng-Li Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for monitoring oxide film deposition
- Publication number 20060177949
- Publication date Aug 10, 2006
- Macronix International Co., Ltd.
- Mao-Chan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
[METHOD OF FORMING A SILICON NITRIDE LAYER]
- Publication number 20050266696
- Publication date Dec 1, 2005
- Ching-Tang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power controller
- Publication number 20020137481
- Publication date Sep 26, 2002
- Chieh-Sheng Chen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Person

Patents Grantslast 30 patents

Heat dissipatable die unit and probe seat using the same

Die plate assembly for probe head

Probe head and probe card

Probe head and die set having horizontally fine adjustable die and...

Through silicon via repair circuit of semiconductor apparatus

Through silicon via repair circuit of semiconductor device

Through silicon via repair circuit

Monitoring method for three-dimensional intergrated circuit (3D IC)...

Through silicon via bidirectional repair circuit of semiconductor a...

Multi-chip stack structure

Monitoring method for through-silicon vias of three-dimensional int...

Electrostatic discharge structure for 3-dimensional integrated circ...

Memories with improved write current

Memory accessing circuit and method

Memory and multi-state sense amplifier thereof

Memory structure and data writing method thereof

Multi-state sense amplifier

Method for monitoring oxide film deposition

Sense amplifier

Programmable memory cell and operation method

Method of forming a silicon nitride layer

Broadband single-ended input upconverter

Power controller

RF power amplifier with high efficiency and a wide range of gain co...

Patents Applicationslast 30 patents

PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...

HEAT DISSIPATABLE DIE UNIT AND PROBE SEAT USING THE SAME

PROBE HEAD AND PROBE CARD

THROUGH SILICON VIA REPAIR CIRCUIT OF SEMICONDUCTOR DEVICE

TENSILE POLYCRYSTALLINE SILICON FILM HAVING STABLE RESISTIVITY AND...

THROUGH SILICON VIA REPAIR CIRCUIT

Voltage-Controlled Oscillator Circuit Structure

THROUGH SILICON VIA BIDIRECTIONAL REPAIR CIRCUIT OF SEMICONDUCTOR A...

THROUGH SILICON VIA REPAIR CIRCUIT OF SEMICONDUCTOR APPARATUS

MONITORING METHOD FOR THREE-DIMENSIONAL INTERGRATED CIRCUIT (3D IC)...

MULTI-CHIP STACK STRUCTURE

STRUCTURE AND METHOD FOR TESTING THROUGH-SILICON VIA (TSV)

ELECTROSTATIC DISCHARGE STRUCTURE FOR 3-DIMENSIONAL INTEGRATED CIRC...

MONITORING METHOD FOR THROUGH-SILICON VIAS OF THREE-DIMENSIONAL INT...

MEMORIES WITH IMPROVED WRITE CURRENT

Memory accessing circuit and method

VOLTAGE DRIVING CIRCUIT

Memory and multi-state sense amplifier thereof

Multi-state sense amplifier

Sense amplifier

MEMORY STRUCTURE AND DATA WRITING METHOD THEREOF

Programmable memory cell and operation method

Thin-film transistor

Method for monitoring oxide film deposition

[METHOD OF FORMING A SILICON NITRIDE LAYER]

Power controller