Keng-Shieng CHANG

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Chu-Pei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Probe holding structure and optical inspection device equipped with...
- Patent number 9,244,018
- Issue date Jan 26, 2016
- MPI Corporation
- Chia-Tai Chang
- G01 - MEASURING TESTING
Information Patent Grant
High frequency probe card
- Patent number 9,201,098
- Issue date Dec 1, 2015
- MPI Corporation
- Chia-Tai Chang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20180335449
- Publication date Nov 22, 2018
- MPI Corporation
- Keng-Sheng CHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDING STRUCTURE AND OPTICAL INSPECTION DEVICE EQUIPPED WITH...
- Publication number 20140016123
- Publication date Jan 16, 2014
- Chia-Tai CHANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE
- Publication number 20140016124
- Publication date Jan 16, 2014
- Chia-Tai CHANG
- G02 - OPTICS
Information Patent Application
HIGH FREQUENCY PROBE CARD
- Publication number 20140015561
- Publication date Jan 16, 2014
- Chia-Tai CHANG
- G01 - MEASURING TESTING