Kengo Imagawa

Person

Fujisawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contamination-inspecting apparatus and detection circuit
- Patent number 8,035,071
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Ramp generator and circuit pattern inspection apparatus using the s...
- Patent number 7,816,955
- Issue date Oct 19, 2010
- Hitachi, Ltd.
- Masayoshi Takahashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device, testing and manufacturing methods thereof
- Patent number 7,668,027
- Issue date Feb 23, 2010
- Renesas Technology Corp.
- Kengo Imagawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and testing method thereof
- Patent number 7,474,290
- Issue date Jan 6, 2009
- Renesas Technology Corp.
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device and the method of testing the same
- Patent number 7,443,373
- Issue date Oct 28, 2008
- Renesas Technology Corp.
- Kengo Imagawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device and testing method of semiconductor device
- Patent number 7,358,953
- Issue date Apr 15, 2008
- Renesas Technology Corp.
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Comparator including a differential transistor pair and a diode arr...
- Patent number 6,774,680
- Issue date Aug 10, 2004
- Hitachi, Ltd.
- Kengo Imagawa
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT
- Publication number 20080278717
- Publication date Nov 13, 2008
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
RAMP GENERATOR AND CIRCUIT PATTERN INSPECTION APPARATUS USING THE S...
- Publication number 20080231330
- Publication date Sep 25, 2008
- Masayoshi Takahashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device, testing and manufacturing methods thereof
- Publication number 20070047345
- Publication date Mar 1, 2007
- Kengo Imagawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and testing method thereof
- Publication number 20050122300
- Publication date Jun 9, 2005
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Semiconductor device and the method of testing the same
- Publication number 20050122297
- Publication date Jun 9, 2005
- Kengo Imagawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Semiconductor device and testing method of semiconductor device
- Publication number 20040189564
- Publication date Sep 30, 2004
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Comparator
- Publication number 20030222681
- Publication date Dec 4, 2003
- Kengo Imagawa
- H03 - BASIC ELECTRONIC CIRCUITRY

Kengo Imagawa

Person

Patents Grantslast 30 patents

Contamination-inspecting apparatus and detection circuit

Ramp generator and circuit pattern inspection apparatus using the s...

Semiconductor device, testing and manufacturing methods thereof

Semiconductor device and testing method thereof

Semiconductor device and the method of testing the same

Semiconductor device and testing method of semiconductor device

Comparator including a differential transistor pair and a diode arr...

Patents Applicationslast 30 patents

CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT

RAMP GENERATOR AND CIRCUIT PATTERN INSPECTION APPARATUS USING THE S...

Semiconductor device, testing and manufacturing methods thereof

Semiconductor device and testing method thereof

Semiconductor device and the method of testing the same

Semiconductor device and testing method of semiconductor device

Comparator