Kenichi Akamatsu

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus structure and scanning probe microscope including apparat...
- Patent number 7,945,964
- Issue date May 17, 2011
- SII NanoTechnology Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS STRUCTURE AND SCANNING PROBE MICROSCOPE INCLUDING APPARAT...
- Publication number 20090255016
- Publication date Oct 8, 2009
- Shigeru Wakiyama
- G01 - MEASURING TESTING