Kenichi Akao

Person

Hachioji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrometer
- Patent number 12,031,864
- Issue date Jul 9, 2024
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Real-time spectral analysis through high-speed spectral classification
- Patent number 11,913,877
- Issue date Feb 27, 2024
- Jasco Corporation
- Koshi Nagamori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopic-measurement apparatus
- Patent number 7,954,069
- Issue date May 31, 2011
- Jasco Corporation
- Masaaki Yumoto
- G02 - OPTICS
Information Patent Grant
Microscopic-measurement apparatus
- Patent number 7,869,039
- Issue date Jan 11, 2011
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Noise-component removing method
- Patent number 7,693,689
- Issue date Apr 6, 2010
- Jasco Corporation
- Jun Koshoubu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Irreversible-reaction measurement method
- Patent number 7,676,337
- Issue date Mar 9, 2010
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Mapping-data analyzing method and apparatus
- Patent number 7,515,769
- Issue date Apr 7, 2009
- Jasco Corporation
- Kenichi Akao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-sensitivity reflection measurement apparatus
- Patent number 7,209,233
- Issue date Apr 24, 2007
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Infrared circular dichroism measuring apparatus and infrared circul...
- Patent number 7,002,692
- Issue date Feb 21, 2006
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROMETER
- Publication number 20230146740
- Publication date May 11, 2023
- JASCO CORPORATION
- Kenichi AKAO
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME SPECTRAL ANALYSIS THROUGH HIGH-SPEED SPECTRAL CLASSIFICATION
- Publication number 20210055211
- Publication date Feb 25, 2021
- JASCO CORPORATION
- Koshi NAGAMORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Microscopic-Measurement Apparatus
- Publication number 20090103173
- Publication date Apr 23, 2009
- JASCO CORPORATION
- Kenichi Akao
- G02 - OPTICS
Information Patent Application
Microscopic-Measurement Apparatus
- Publication number 20080282197
- Publication date Nov 13, 2008
- JASCO CORPORATION
- Masaaki Yumoto
- G02 - OPTICS
Information Patent Application
Noise-Component Removing Method
- Publication number 20080154549
- Publication date Jun 26, 2008
- JASCO CORPORATION
- Jun Koshoubu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Irreversible-Reaction Measurement Method
- Publication number 20080147331
- Publication date Jun 19, 2008
- JASCO CORPORATION
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Application
High-sensitivity reflection measurement apparatus
- Publication number 20050195395
- Publication date Sep 8, 2005
- JASCO CORPORATION
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Application
Infrared circular dichroism measuring apparatus and infrared circul...
- Publication number 20030234937
- Publication date Dec 25, 2003
- JASCO CORPORATION
- Kenichi Akao
- G01 - MEASURING TESTING

Kenichi Akao

Person

Patents Grantslast 30 patents

Spectrometer

Real-time spectral analysis through high-speed spectral classification

Microscopic-measurement apparatus

Microscopic-measurement apparatus

Noise-component removing method

Irreversible-reaction measurement method

Mapping-data analyzing method and apparatus

High-sensitivity reflection measurement apparatus

Infrared circular dichroism measuring apparatus and infrared circul...

Patents Applicationslast 30 patents

SPECTROMETER

REAL-TIME SPECTRAL ANALYSIS THROUGH HIGH-SPEED SPECTRAL CLASSIFICATION

Microscopic-Measurement Apparatus

Microscopic-Measurement Apparatus

Noise-Component Removing Method

Irreversible-Reaction Measurement Method

High-sensitivity reflection measurement apparatus

Infrared circular dichroism measuring apparatus and infrared circul...