Kenichi Ao

Person

Obu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Magnetic sensor and method for manufacturing said magnetic sensor
- Patent number 10,901,049
- Issue date Jan 26, 2021
- Denso Corporation
- Takamoto Furuichi
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-resistance element and magnetic sensor using the same
- Patent number 9,905,752
- Issue date Feb 27, 2018
- Denso Corporation
- Toshifumi Yano
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic sensor
- Patent number 9,753,100
- Issue date Sep 5, 2017
- Denso Corporation
- Toshifumi Yano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic quantity sensor device and manufacturing method of the same
- Patent number 8,829,627
- Issue date Sep 9, 2014
- Denso Corporation
- Tetsuo Fujii
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Angular velocity sensor
- Patent number 8,549,916
- Issue date Oct 8, 2013
- Denso Corporation
- Minekazu Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing magnetic sensor apparatus
- Patent number 7,582,489
- Issue date Sep 1, 2009
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic impedance device, sensor apparatus using the same and meth...
- Patent number 7,417,269
- Issue date Aug 26, 2008
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor
- Patent number 7,298,022
- Issue date Nov 20, 2007
- Denso Corporation
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity sensor having angular speed sensor and accelerati...
- Patent number 7,290,449
- Issue date Nov 6, 2007
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 7,250,760
- Issue date Jul 31, 2007
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Vibratory angular rate sensor
- Patent number 7,216,538
- Issue date May 15, 2007
- Denso Corporation
- Hajime Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device capable of sensing dyn...
- Patent number 6,906,394
- Issue date Jun 14, 2005
- Denso Corporation
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device having a moveable member therein and a protect...
- Patent number 6,787,866
- Issue date Sep 7, 2004
- Denso Corporation
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of manufacturing semiconductor device capable of sensing dyn...
- Patent number 6,753,201
- Issue date Jun 22, 2004
- Denso Corporation
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Oscillatory angular rate sensor
- Patent number 6,658,937
- Issue date Dec 9, 2003
- Denso Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor acceleration sensor
- Patent number 6,448,624
- Issue date Sep 10, 2002
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device produced by dicing
- Patent number 6,429,506
- Issue date Aug 6, 2002
- Denso Corporation
- Tetsuo Fujii
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method for producing a semiconductor
- Patent number 6,270,685
- Issue date Aug 7, 2001
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor dynamical quantity sensor device having electrodes in...
- Patent number 6,151,966
- Issue date Nov 28, 2000
- Denso Corporation
- Minekazu Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Switching apparatus having magnetoresistive elements for detecting...
- Patent number 6,150,808
- Issue date Nov 21, 2000
- Denso Corporation
- Hiroshi Yagyu
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Method for fabrication of a semiconductor sensor
- Patent number 6,143,584
- Issue date Nov 7, 2000
- Denso Corporation
- Tsuyoshi Fukada
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a semiconductor dynamic sensor using an anisot...
- Patent number 6,130,010
- Issue date Oct 10, 2000
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor physical quantity sensor with stopper portion
- Patent number 6,065,341
- Issue date May 23, 2000
- Denso Corporation
- Seiichiro Ishio
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of producing semiconductor device by dicing
- Patent number 5,998,234
- Issue date Dec 7, 1999
- Denso Corporation
- Minoru Murata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor physical quantity sensor
- Patent number 5,987,989
- Issue date Nov 23, 1999
- Denso Corporation
- Toshimasa Yamamoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor sensor having multi-layer movable beam structure film
- Patent number 5,936,159
- Issue date Aug 10, 1999
- Nippondenso Co., Ltd.
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sensor having suspended thin-film structure and metho...
- Patent number 5,922,212
- Issue date Jul 13, 1999
- Nippondenso Co., Ltd.
- Kazuhiko Kano
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor strain sensor
- Patent number 5,869,876
- Issue date Feb 9, 1999
- Denso Corporation
- Seiichiro Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensor having coaxially-arranged fixed electrode and m...
- Patent number 5,864,064
- Issue date Jan 26, 1999
- Nippondenso Co., Ltd.
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating a semiconductor acceleration sensor
- Patent number 5,851,851
- Issue date Dec 22, 1998
- Nippondenso Co., Ltd.
- Hirofumi Uenoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR AND METHOD FOR MANUFACTURING SAID MAGNETIC SENSOR
- Publication number 20190242957
- Publication date Aug 8, 2019
- DENSO CORPORATION
- Takamoto FURUICHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20190137578
- Publication date May 9, 2019
- DENSO CORPORATION
- Takamoto FURUICHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20160341801
- Publication date Nov 24, 2016
- Denso Corporation
- Toshifumi YANO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-RESISTANCE ELEMENT AND MAGNETIC SENSOR USING THE SAME
- Publication number 20160218277
- Publication date Jul 28, 2016
- Denso Corporation
- Toshifumi YANO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
- Publication number 20150325538
- Publication date Nov 12, 2015
- Toyota Jidosha Kabushiki Kaisha
- Kazuya ASAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DYNAMIC QUANTITY SENSOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20120299127
- Publication date Nov 29, 2012
- DENSO CORPORATION
- Tetsuo FUJII
- B60 - VEHICLES IN GENERAL
Information Patent Application
ANGULAR VELOCITY SENSOR
- Publication number 20110271758
- Publication date Nov 10, 2011
- DENSO CORPORATION
- Minekazu SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing magnetic sensor apparatus
- Publication number 20080145956
- Publication date Jun 19, 2008
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Magnetic impedance device, sensor apparatus using the same and meth...
- Publication number 20070108970
- Publication date May 17, 2007
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Magnetic sensor
- Publication number 20070018642
- Publication date Jan 25, 2007
- DENSO CORPORATION
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Vibratory angular rate sensor
- Publication number 20060027019
- Publication date Feb 9, 2006
- DENSO Corporation
- Hajime Ito
- G01 - MEASURING TESTING
Information Patent Application
Physical quantity sensor having angular speed sensor and accelerati...
- Publication number 20050217377
- Publication date Oct 6, 2005
- DENSO Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Physical quantity sensor having angular speed sensor and accelerati...
- Publication number 20050217372
- Publication date Oct 6, 2005
- DENSO Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor sensor
- Publication number 20050156309
- Publication date Jul 21, 2005
- Tetsuo Fujii
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Magnetic sensor
- Publication number 20040189294
- Publication date Sep 30, 2004
- DENSO Corporation
- Masato Ishihara
- G01 - MEASURING TESTING
Information Patent Application
Magnetic sensor and method for fabricating the same
- Publication number 20040174164
- Publication date Sep 9, 2004
- DENSO Corporation
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Magnetic impedance device, sensor apparatus using the same and meth...
- Publication number 20040131887
- Publication date Jul 8, 2004
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor device capable of sensing dyn...
- Publication number 20030201506
- Publication date Oct 30, 2003
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Oscillatory angular rate sensor
- Publication number 20030010121
- Publication date Jan 16, 2003
- Kenichi Ao
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor device capable of sensing dyn...
- Publication number 20020177252
- Publication date Nov 28, 2002
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor device and method for producing the same by dicing
- Publication number 20020093076
- Publication date Jul 18, 2002
- Tetsuo Fujii
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Person

Patents Grantslast 30 patents

Magnetic sensor and method for manufacturing said magnetic sensor

Magneto-resistance element and magnetic sensor using the same

Magnetic sensor

Dynamic quantity sensor device and manufacturing method of the same

Angular velocity sensor

Method for manufacturing magnetic sensor apparatus

Magnetic impedance device, sensor apparatus using the same and meth...

Semiconductor sensor

Physical quantity sensor having angular speed sensor and accelerati...

Magnetic sensor

Vibratory angular rate sensor

Method of manufacturing semiconductor device capable of sensing dyn...

Semiconductor device having a moveable member therein and a protect...

Method of manufacturing semiconductor device capable of sensing dyn...

Oscillatory angular rate sensor

Semiconductor acceleration sensor

Semiconductor device produced by dicing

Method for producing a semiconductor

Semiconductor dynamical quantity sensor device having electrodes in...

Switching apparatus having magnetoresistive elements for detecting...

Method for fabrication of a semiconductor sensor

Method for producing a semiconductor dynamic sensor using an anisot...

Semiconductor physical quantity sensor with stopper portion

Method of producing semiconductor device by dicing

Semiconductor physical quantity sensor

Semiconductor sensor having multi-layer movable beam structure film

Semiconductor sensor having suspended thin-film structure and metho...

Semiconductor strain sensor

Acceleration sensor having coaxially-arranged fixed electrode and m...

Method for fabricating a semiconductor acceleration sensor

Patents Applicationslast 30 patents

MAGNETIC SENSOR AND METHOD FOR MANUFACTURING SAID MAGNETIC SENSOR

MAGNETIC SENSOR

MAGNETIC SENSOR

MAGNETO-RESISTANCE ELEMENT AND MAGNETIC SENSOR USING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE

DYNAMIC QUANTITY SENSOR DEVICE AND MANUFACTURING METHOD OF THE SAME

ANGULAR VELOCITY SENSOR

Method for manufacturing magnetic sensor apparatus

Magnetic impedance device, sensor apparatus using the same and meth...

Magnetic sensor

Vibratory angular rate sensor

Physical quantity sensor having angular speed sensor and accelerati...

Physical quantity sensor having angular speed sensor and accelerati...

Semiconductor sensor

Magnetic sensor

Magnetic sensor and method for fabricating the same

Magnetic impedance device, sensor apparatus using the same and meth...

Method of manufacturing semiconductor device capable of sensing dyn...

Oscillatory angular rate sensor

Method of manufacturing semiconductor device capable of sensing dyn...

Semiconductor device and method for producing the same by dicing