Kenichi GOMI

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing semiconductor integrated circuits,...
- Patent number 8,656,232
- Issue date Feb 18, 2014
- Fujitsu Semiconductor Limited
- Yusuke Tanefusa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MEMORY TEST METHOD
- Publication number 20140068193
- Publication date Mar 6, 2014
- FUJITSU SEMICONDUCTOR LIMITED
- Hitoshi YAMANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS,...
- Publication number 20110219276
- Publication date Sep 8, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Yusuke TANEFUSA
- G11 - INFORMATION STORAGE