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Kenichi Iwanaga
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Kawasaki, JP
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last 30 patents
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Patent Grant
Magnetic flaw detection apparatus using an E-shaped magnetic sensor...
Patent number
6,057,684
Issue date
May 2, 2000
Murakami; Yoshihiro
Yoshihiro Murakami
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for magnetically detecting defects in an objec...
Patent number
5,512,821
Issue date
Apr 30, 1996
NKK Corporation
Seigo Ando
G01 - MEASURING TESTING
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Patent Grant
Magnetic inspection apparatus for thin steel strip having magnetize...
Patent number
5,235,275
Issue date
Aug 10, 1993
NKK Corporation
Seigo Ando
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for detecting defects in a moving steel strip with a magn...
Patent number
5,089,776
Issue date
Feb 18, 1992
NKK Corporation
Takato Furukawa
G01 - MEASURING TESTING