Kenichi Kadota

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Failure detecting method, failure detecting apparatus, and semicond...
- Patent number 8,170,707
- Issue date May 1, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Linear pattern detection method and apparatus
- Patent number 8,081,814
- Issue date Dec 20, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate, substrate inspection method, semiconductor...
- Patent number 7,973,281
- Issue date Jul 5, 2011
- Kabushiki Kaisha Toshiba
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate, substrate inspection method, semiconductor...
- Patent number 7,573,066
- Issue date Aug 11, 2009
- Kabushiki Kaisha Toshiba
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing fail bit maps of waters and apparatus therefor
- Patent number 7,405,088
- Issue date Jul 29, 2008
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for monitoring manufacturing apparatuses
- Patent number 7,221,991
- Issue date May 22, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying a manufacturing tool causing a fault
- Patent number 7,197,414
- Issue date Mar 27, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for analyzing fail bit maps of wafers
- Patent number 7,138,283
- Issue date Nov 21, 2006
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Grant
System for, method of and computer program product for detecting fa...
- Patent number 7,062,409
- Issue date Jun 13, 2006
- Kabushiki Kaisha Toshiba
- Kenichi Kadota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Failure detection system, failure detection method, and computer pr...
- Patent number 7,043,384
- Issue date May 9, 2006
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Grant
Analysis method for semiconductor device, analysis system and a com...
- Patent number 6,975,953
- Issue date Dec 13, 2005
- Kabushiki Kaisha Toshiba
- Kenichi Kadota
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION METHOD AND MANUFACTURING CONTROL SYSTEM
- Publication number 20140236337
- Publication date Aug 21, 2014
- KABUSHIKI KAISHA TOSHIBA
- Kenji Kawabata
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate, substrate inspection method, semiconductor...
- Publication number 20090272901
- Publication date Nov 5, 2009
- Kabushiki Kaisha Toshiba
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LINEAR PATTERN DETECTION METHOD AND APPARATUS
- Publication number 20090220142
- Publication date Sep 3, 2009
- Hiroshi MATSUSHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAILURE DETECTING METHOD, FAILURE DETECTING APPARATUS, AND SEMICOND...
- Publication number 20090117673
- Publication date May 7, 2009
- Hiroshi MATSUSHITA
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor substrate, substrate inspection method, semiconductor...
- Publication number 20080011947
- Publication date Jan 17, 2008
- Hiroyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for identifying a manufacturing tool causing a fault
- Publication number 20050251365
- Publication date Nov 10, 2005
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
System and method for controlling manufacturing apparatuses
- Publication number 20050194590
- Publication date Sep 8, 2005
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Failure detection system, failure detection method, and computer pr...
- Publication number 20050102591
- Publication date May 12, 2005
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Application
System for, method of and computer program product for detecting fa...
- Publication number 20050021299
- Publication date Jan 27, 2005
- Kabushiki Kaisha Toshiba
- Kenichi Kadota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for analyzing fail bit maps of wafers
- Publication number 20050021303
- Publication date Jan 27, 2005
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Application
Method for analyzing fail bit maps of wafers and apparatus therefor
- Publication number 20040255198
- Publication date Dec 16, 2004
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis method for semiconductor device, analysis system and a com...
- Publication number 20040228186
- Publication date Nov 18, 2004
- Kenichi Kadota
- H01 - BASIC ELECTRIC ELEMENTS

Kenichi Kadota

Person

Patents Grantslast 30 patents

Failure detecting method, failure detecting apparatus, and semicond...

Linear pattern detection method and apparatus

Semiconductor substrate, substrate inspection method, semiconductor...

Semiconductor substrate, substrate inspection method, semiconductor...

Method for analyzing fail bit maps of waters and apparatus therefor

System and method for monitoring manufacturing apparatuses

System and method for identifying a manufacturing tool causing a fault

Method for analyzing fail bit maps of wafers

System for, method of and computer program product for detecting fa...

Failure detection system, failure detection method, and computer pr...

Analysis method for semiconductor device, analysis system and a com...

Patents Applicationslast 30 patents

PATTERN INSPECTION METHOD AND MANUFACTURING CONTROL SYSTEM

Semiconductor substrate, substrate inspection method, semiconductor...

LINEAR PATTERN DETECTION METHOD AND APPARATUS

FAILURE DETECTING METHOD, FAILURE DETECTING APPARATUS, AND SEMICOND...

Semiconductor substrate, substrate inspection method, semiconductor...

System and method for identifying a manufacturing tool causing a fault

System and method for controlling manufacturing apparatuses

Failure detection system, failure detection method, and computer pr...

System for, method of and computer program product for detecting fa...

Method for analyzing fail bit maps of wafers

Method for analyzing fail bit maps of wafers and apparatus therefor

Analysis method for semiconductor device, analysis system and a com...