Kenichi Kobayashi

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
System in-package test inspection apparatus and test inspection method
- Patent number 7,414,422
- Issue date Aug 19, 2008
- National Institute of Advanced Industrial Science and Technology
- Masahiro Aoyagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System in-package test inspection apparatus and test inspection method
- Publication number 20050236717
- Publication date Oct 27, 2005
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Masahiro Aoyagi
- G01 - MEASURING TESTING