Kenichi MATOBA

Person

Otsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical measurement device
- Patent number 11,674,794
- Issue date Jun 13, 2023
- Omron Corporation
- Hisayasu Morino
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 11,194,047
- Issue date Dec 7, 2021
- Omron Corporation
- Yosuke Kajii
- G01 - MEASURING TESTING
Information Patent Grant
Inclination measuring device
- Patent number 10,830,587
- Issue date Nov 10, 2020
- Omron Corporation
- Kosuke Sugiyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical measurement device
- Patent number 10,551,171
- Issue date Feb 4, 2020
- Omron Corporation
- Hisayasu Morino
- G01 - MEASURING TESTING
Information Patent Grant
Confocal measurement device
- Patent number 10,520,296
- Issue date Dec 31, 2019
- Omron Corporation
- Hisayasu Morino
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring device, measuring system and displacement me...
- Patent number 10,495,448
- Issue date Dec 3, 2019
- Omron Corporation
- Tomonori Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Displacement measurement device, measurement system, and displaceme...
- Patent number 10,444,360
- Issue date Oct 15, 2019
- Omron Corporation
- Tomonori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device
- Patent number 9,995,624
- Issue date Jun 12, 2018
- Omron Corporation
- Hisayasu Morino
- G02 - OPTICS
Information Patent Grant
Optical device having polarizer and non-active retarders for spectr...
- Patent number 9,645,011
- Issue date May 9, 2017
- Omron Corporation
- Hiroshi Okabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20230266118
- Publication date Aug 24, 2023
- Omron Corporation
- Hisayasu MORINO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20230266119
- Publication date Aug 24, 2023
- Omron Corporation
- Hisayasu MORINO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20190346258
- Publication date Nov 14, 2019
- Omron Corporation
- Hisayasu MORINO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20190219695
- Publication date Jul 18, 2019
- Omron Corporation
- Yosuke KAJII
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL MEASUREMENT DEVICE
- Publication number 20190101375
- Publication date Apr 4, 2019
- Omron Corporation
- Hisayasu MORINO
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASURING DEVICE, MEASURING SYSTEM AND DISPLACEMENT ME...
- Publication number 20190094013
- Publication date Mar 28, 2019
- Omron Corporation
- Tomonori KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND DISPLACEME...
- Publication number 20190094368
- Publication date Mar 28, 2019
- Omron Corporation
- Tomonori KONDO
- G01 - MEASURING TESTING
Information Patent Application
INCLINATION MEASURING DEVICE
- Publication number 20180216933
- Publication date Aug 2, 2018
- Omron Corporation
- Kosuke SUGIYAMA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20170276475
- Publication date Sep 28, 2017
- Omron Corporation
- Hisayasu MORINO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20170160130
- Publication date Jun 8, 2017
- Omron Corporation
- Hisayasu MORINO
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE HAVING POLARIZER AND RETARDERS FOR SPECTROSCOPIC POL...
- Publication number 20110080586
- Publication date Apr 7, 2011
- OMRON CORPORATION
- HIRSOHI OKABE
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic polarimetry
- Publication number 20060238759
- Publication date Oct 26, 2006
- OMRON CORPORATION
- Hiroshi Okabe
- G01 - MEASURING TESTING

Kenichi MATOBA

Person

Patents Grantslast 30 patents

Optical measurement device

Optical measurement device and optical measurement method

Inclination measuring device

Optical measurement device

Confocal measurement device

Displacement measuring device, measuring system and displacement me...

Displacement measurement device, measurement system, and displaceme...

Optical measurement device

Optical device having polarizer and non-active retarders for spectr...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT DEVICE

OPTICAL MEASUREMENT DEVICE

OPTICAL MEASUREMENT DEVICE

OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

CONFOCAL MEASUREMENT DEVICE

DISPLACEMENT MEASURING DEVICE, MEASURING SYSTEM AND DISPLACEMENT ME...

DISPLACEMENT MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND DISPLACEME...

INCLINATION MEASURING DEVICE

OPTICAL MEASUREMENT DEVICE

OPTICAL MEASUREMENT DEVICE

OPTICAL DEVICE HAVING POLARIZER AND RETARDERS FOR SPECTROSCOPIC POL...

Spectroscopic polarimetry