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Kenichi Nakayama
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inductive detection encoder and digital micrometer
Patent number
8,878,523
Issue date
Nov 4, 2014
Mitutoyo Corporation
Hirokazu Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic induction type encoder
Patent number
7,906,958
Issue date
Mar 15, 2011
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Inductive displacement detector and micrometer
Patent number
7,081,746
Issue date
Jul 25, 2006
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic encoder
Patent number
6,646,434
Issue date
Nov 11, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance type displacement detection apparatus
Patent number
6,593,757
Issue date
Jul 15, 2003
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance type displacement detection apparatus and method of man...
Patent number
6,538,457
Issue date
Mar 25, 2003
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measuring device
Patent number
6,492,820
Issue date
Dec 10, 2002
Mitutoyo Corporation
Satoshi Adachi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INDUCTIVE DETECTION ENCODER AND DIGITAL MICROMETER
Publication number
20130069637
Publication date
Mar 21, 2013
Mitutoyo Corporation
Hirokazu Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
Electromagnetic induction type encoder
Publication number
20090195241
Publication date
Aug 6, 2009
MITUTOYO CORPORATIOIN
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Inductive displacement detector and micrometer
Publication number
20050122197
Publication date
Jun 9, 2005
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING
Information
Patent Application
Magnetic encoder
Publication number
20030080733
Publication date
May 1, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Capacitance type displacement detection apparatus
Publication number
20030067309
Publication date
Apr 10, 2003
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Capacitance type displacement detection apparatus
Publication number
20010038292
Publication date
Nov 8, 2001
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Capacitance type displacement detection apparatus and method of man...
Publication number
20010009373
Publication date
Jul 26, 2001
Mitutoyo Corporation
Kenichi Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Displacement measuring device
Publication number
20010005139
Publication date
Jun 28, 2001
Mitutoyo Corporation
Satoshi Adachi
G01 - MEASURING TESTING