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Kenichi Narikawa

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  • Nirasaki City, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST METHOD OF TEST SYSTEM AND TEST SYSTEM
    • Publication number 20240345155
    • Publication date Oct 17, 2024
    • TOKYO ELECTRON LIMITED
    • Kenichi NARIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING SYSTEM
    • Publication number 20210333319
    • Publication date Oct 28, 2021
    • TOKYO ELECTRON LIMITED
    • Kentaro KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    VOLTAGE APPLICATION DEVICE AND METHOD OF FORMING OUTPUT VOLTAGE WAV...
    • Publication number 20200278392
    • Publication date Sep 3, 2020
    • TOKYO ELECTRON LIMITED
    • Shigeki Ishii
    • G01 - MEASURING TESTING
  • Information Patent Application

    TOKYO ELECTRON LMITED
    • Publication number 20190178913
    • Publication date Jun 13, 2019
    • TOKYO ELECTRON LIMITED
    • Kenichi NARIKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SUBSTRATE INSPECTION APPARATUS
    • Publication number 20190128952
    • Publication date May 2, 2019
    • TOKYO ELECTRON LIMITED
    • Katsuaki Sugiyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SUBSTRATE INSPECTION APPARATUS
    • Publication number 20150077152
    • Publication date Mar 19, 2015
    • TOKYO ELECTRON LIMITED
    • Michio Murata
    • G01 - MEASURING TESTING