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Kenichi Nishigaki

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzing apparatus
    • Patent number 10,191,074
    • Issue date Jan 29, 2019
    • Hitachi High-Technologies Corporation
    • Kenichi Nishigaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 9,575,083
    • Issue date Feb 21, 2017
    • Hitachi High-Technologies Corporation
    • Kenichi Nishigaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer and maintenance method for same
    • Patent number 9,316,662
    • Issue date Apr 19, 2016
    • Hitachi High-Technologies Corporation
    • Ryohei Ishigami
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,521,703
    • Issue date Apr 21, 2009
    • Hitachi High-Technologies Corp.
    • Kenichi Nishigaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic Analyzer and Control Method Thereof
    • Publication number 20250020682
    • Publication date Jan 16, 2025
    • Hitachi High-Tech Corporation
    • Shinya TANAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20240094134
    • Publication date Mar 21, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Hikaru Karo
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS
    • Publication number 20170227563
    • Publication date Aug 10, 2017
    • Hitachi High-Technologies Corporation
    • Kenichi NISHIGAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20150369831
    • Publication date Dec 24, 2015
    • Hitachi High-Technologies Corporation
    • Kenichi NISHIGAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND MAINTENANCE METHOD FOR SAME
    • Publication number 20140202828
    • Publication date Jul 24, 2014
    • Hitachi High-Technologies Corporation
    • Ryohei Ishigami
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130243652
    • Publication date Sep 19, 2013
    • Hitachi High-Technologies Corporation
    • Kenichi Nishigaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20070181787
    • Publication date Aug 9, 2007
    • Kenichi Nishigaki
    • G01 - MEASURING TESTING