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Kenichi Nishinaka

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  • Chiba, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Focused ion beam apparatus
    • Patent number 8,822,945
    • Issue date Sep 2, 2014
    • SII NanoTechnology Inc.
    • Kenichi Nishinaka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus
    • Patent number 8,513,602
    • Issue date Aug 20, 2013
    • SII NanoTechnology Inc.
    • Takashi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus
    • Patent number 8,389,953
    • Issue date Mar 5, 2013
    • SII NanoTechnology Inc.
    • Takashi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus
    • Patent number 7,755,065
    • Issue date Jul 13, 2010
    • SII NanoTechnology Inc.
    • Yoshitomo Nakagawa
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Focused ion beam apparatus
    • Publication number 20110233401
    • Publication date Sep 29, 2011
    • Kenichi Nishinaka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Focused ion beam apparatus
    • Publication number 20110215256
    • Publication date Sep 8, 2011
    • Takashi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Focused ion beam apparatus
    • Publication number 20110204252
    • Publication date Aug 25, 2011
    • Takashi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    FOCUSED ION BEAM APPARATUS
    • Publication number 20100219339
    • Publication date Sep 2, 2010
    • Takashi Ogawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    FOCUSED ION BEAM APPARATUS
    • Publication number 20080308741
    • Publication date Dec 18, 2008
    • Yoshitomo Nakagawa
    • H01 - BASIC ELECTRIC ELEMENTS