Kenichi Noguchi

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Omiya, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image pickup device with attached interference stripe noise prevent...
- Patent number 5,543,612
- Issue date Aug 6, 1996
- Texas Instruments Incorporated
- Motonori Kanaya
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric surface inspection machine designed to support an e...
- Patent number 5,377,007
- Issue date Dec 27, 1994
- Fuji Photo Optical Co., Ltd.
- Kenji Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer for inspecting the surface of a specimen
- Patent number 5,127,734
- Issue date Jul 7, 1992
- Fuji Photo Optical Co., Ltd.
- Shigenori Ohi
- G01 - MEASURING TESTING