Kenichi Okajima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray image generation device
- Patent number 11,487,043
- Issue date Nov 1, 2022
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS
- Publication number 20230288348
- Publication date Sep 14, 2023
- Rigaku Corporation
- Masashi KAGEYAMA
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE INFORMATION ACQUISITION METHOD AND STRUCTURE INFORMATION...
- Publication number 20230160840
- Publication date May 25, 2023
- Rigaku Corporation
- Masashi KAGEYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGE GENERATION DEVICE
- Publication number 20210382196
- Publication date Dec 9, 2021
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING