Kenichi Shinbo

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for mass spectrometry
- Patent number 7,928,365
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system
- Patent number 7,890,074
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and its apparatus for mass spectrometry
- Patent number 7,476,850
- Issue date Jan 13, 2009
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrow-directivity electromagnetic-field antenna probe, and electro...
- Patent number 7,132,997
- Issue date Nov 7, 2006
- Hitachi, Ltd.
- Kouichi Uesaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulse generation circuit and semiconductor tester that uses the pul...
- Patent number 7,085,982
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Kenichi Shinbo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 6,768,953
- Issue date Jul 27, 2004
- Hitachi, Ltd.
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 6,697,755
- Issue date Feb 24, 2004
- Hitachi, Ltd.
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting electromagnetic wave source, and...
- Patent number 6,617,860
- Issue date Sep 9, 2003
- Hitachi, Ltd.
- Kouichi Uesaka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting electromagnetic wave source, and...
- Patent number 6,411,104
- Issue date Jun 25, 2002
- Hitachi, Ltd.
- Kouichi Uesaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MASS SPECTROMETRY
- Publication number 20110192970
- Publication date Aug 11, 2011
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS DIAGNOSING METHOD, APPARATUS DIAGNOSIS MODULE, AND APPARA...
- Publication number 20080244329
- Publication date Oct 2, 2008
- Kenichi SHINBO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA ACQUISITION SYSTEM
- Publication number 20080073504
- Publication date Mar 27, 2008
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and its apparatus for mass spectrometry
- Publication number 20060289739
- Publication date Dec 28, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for mass spectrometry
- Publication number 20060248942
- Publication date Nov 9, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Narrow-directivity electromagnetic-field antenna probe, and electro...
- Publication number 20040135734
- Publication date Jul 15, 2004
- Kouichi Uesaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test apparatus
- Publication number 20030167145
- Publication date Sep 4, 2003
- Hitachi, Ltd
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Application
Pulse generation circuit and semiconductor tester that uses the pul...
- Publication number 20030140286
- Publication date Jul 24, 2003
- Kenichi Shinbo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test apparatus
- Publication number 20030040874
- Publication date Feb 27, 2003
- HITACHI, LTD.
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting electromagnetic wave source, and...
- Publication number 20020153904
- Publication date Oct 24, 2002
- Kouichi Uesaka
- G01 - MEASURING TESTING

Kenichi Shinbo

Person

Patents Grantslast 30 patents

Method and apparatus for mass spectrometry

Data acquisition system

Method and its apparatus for mass spectrometry

Narrow-directivity electromagnetic-field antenna probe, and electro...

Pulse generation circuit and semiconductor tester that uses the pul...

Test apparatus

Test apparatus

Apparatus and method for detecting electromagnetic wave source, and...

Apparatus and method for detecting electromagnetic wave source, and...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MASS SPECTROMETRY

APPARATUS DIAGNOSING METHOD, APPARATUS DIAGNOSIS MODULE, AND APPARA...

DATA ACQUISITION SYSTEM

Method and its apparatus for mass spectrometry

Method and apparatus for mass spectrometry

Narrow-directivity electromagnetic-field antenna probe, and electro...

Test apparatus

Pulse generation circuit and semiconductor tester that uses the pul...

Test apparatus

Apparatus and method for detecting electromagnetic wave source, and...