Kenichi SHITARA

Person

Ashigarakami-gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical surface defect inspection apparatus and optical surface def...
- Patent number 8,547,547
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Shintaro Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,502,966
- Issue date Aug 6, 2013
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,488,116
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G01 - MEASURING TESTING
Information Patent Grant
Disk protrusion detection/flatness measurement circuit and disk gli...
- Patent number 8,457,926
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G11 - INFORMATION STORAGE
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,294,888
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting a magnetic disk
- Patent number 8,295,000
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G11 - INFORMATION STORAGE
Information Patent Grant
Deterioration detection method of composite magnetic head and magne...
- Patent number 8,089,714
- Issue date Jan 3, 2012
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for measuring optimum seeking time and inspection apparatus...
- Patent number 8,031,421
- Issue date Oct 4, 2011
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method of a magnetic disk and magnectic disk tester
- Patent number 7,929,232
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20130027693
- Publication date Jan 31, 2013
- Kenichi SHITARA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20130027694
- Publication date Jan 31, 2013
- Kenichi SHITARA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20120075625
- Publication date Mar 29, 2012
- Shintaro TAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING MAGNETIC DISK
- Publication number 20120026622
- Publication date Feb 2, 2012
- Hitachi High-Technologies Corporation
- Kenichi SHITARA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC DISK
- Publication number 20110188143
- Publication date Aug 4, 2011
- Hitachi High-Technologies Corporation
- Kenichi SHITARA
- G11 - INFORMATION STORAGE
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20110075148
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Kenichi SHITARA
- G01 - MEASURING TESTING
Information Patent Application
DISK PROTRUSION DETECTION/FLATNESS MEASUREMENT CIRCUIT AND DISK GLI...
- Publication number 20110051580
- Publication date Mar 3, 2011
- Hitachi High-Technologies Corporation
- Kenichi SHITARA
- G11 - INFORMATION STORAGE
Information Patent Application
DETERIORATION DETECTION METHOD OF COMPOSITE MAGNETIC HEAD AND MAGNE...
- Publication number 20110002060
- Publication date Jan 6, 2011
- HITACHI HIGH-TECHNOLOGIES COPORATION
- Kenichi SHITARA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MEASURING OPTIMUM SEEKING TIME AND INSPECTION APPARATUS...
- Publication number 20100302665
- Publication date Dec 2, 2010
- Hitachi High-Technologies Corporation
- Kenichi SHITARA
- G11 - INFORMATION STORAGE
Information Patent Application
TEST METHOD OF A MAGNETIC DISK AND MAGNECTIC DISK TESTER
- Publication number 20080198493
- Publication date Aug 21, 2008
- Kenichi SHITARA
- G11 - INFORMATION STORAGE

Kenichi SHITARA

Person

Patents Grantslast 30 patents

Optical surface defect inspection apparatus and optical surface def...

Surface defect inspection method and apparatus

Surface defect inspection method and apparatus

Disk protrusion detection/flatness measurement circuit and disk gli...

Surface defect inspection method and apparatus

Method and its apparatus for inspecting a magnetic disk

Deterioration detection method of composite magnetic head and magne...

Method for measuring optimum seeking time and inspection apparatus...

Test method of a magnetic disk and magnectic disk tester

Patents Applicationslast 30 patents

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...

METHOD AND APPARATUS FOR INSPECTING MAGNETIC DISK

METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC DISK

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

DISK PROTRUSION DETECTION/FLATNESS MEASUREMENT CIRCUIT AND DISK GLI...

DETERIORATION DETECTION METHOD OF COMPOSITE MAGNETIC HEAD AND MAGNE...

METHOD FOR MEASURING OPTIMUM SEEKING TIME AND INSPECTION APPARATUS...

TEST METHOD OF A MAGNETIC DISK AND MAGNECTIC DISK TESTER