Kenichi Takano

Person

Saku-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Magnetic sensor
- Patent number 12,072,399
- Issue date Aug 27, 2024
- TDK Corporation
- Kentaro Harada
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor having soft magnetic bodies for adjusting magnetic f...
- Patent number 11,892,477
- Issue date Feb 6, 2024
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 11,762,044
- Issue date Sep 19, 2023
- TDK Corporation
- Kentaro Harada
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor, and a current sensor and position detection device...
- Patent number 11,675,028
- Issue date Jun 13, 2023
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 11,579,213
- Issue date Feb 14, 2023
- TDK Corporation
- Kenichi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field detection device
- Patent number 11,531,071
- Issue date Dec 20, 2022
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor, and a current sensor and position detection device...
- Patent number 11,506,733
- Issue date Nov 22, 2022
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 11,408,950
- Issue date Aug 9, 2022
- TDK Corporation
- Kentaro Harada
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor having soft magnetic bodies for adjusting magnetic f...
- Patent number 11,293,950
- Issue date Apr 5, 2022
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor device and current sensor
- Patent number 11,181,557
- Issue date Nov 23, 2021
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 11,156,478
- Issue date Oct 26, 2021
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detection device
- Patent number 11,002,803
- Issue date May 11, 2021
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 10,983,181
- Issue date Apr 20, 2021
- TDK Corporation
- Kenichi Takano
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Offset estimation apparatus and method, correction apparatus for ma...
- Patent number 10,859,606
- Issue date Dec 8, 2020
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer test system
- Patent number 10,845,383
- Issue date Nov 24, 2020
- Keysight Technologies, Inc.
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Perpendicular spin torque oscillator FMR frequency measurement method
- Patent number 9,222,994
- Issue date Dec 29, 2015
- TDK Corporation
- Yuchen Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Heat assisted narrow pole design with trailing shield
- Patent number 8,986,556
- Issue date Mar 24, 2015
- Headway Technologies, Inc.
- Xuhui Jin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermally-assisted magnetic write head, head gimbal assembly, head...
- Patent number 8,861,135
- Issue date Oct 14, 2014
- TDK Corporation
- Kenichi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Perpendicular magnetic recording write head with milling defined tr...
- Patent number 8,625,235
- Issue date Jan 7, 2014
- Headway Technologies, Inc.
- Kenichi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for characterization evaluation of thermally-assisted magnet...
- Patent number 8,614,934
- Issue date Dec 24, 2013
- TDK Corporation
- Satoshi Tomikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fabricating a magnetic head device
- Patent number 6,898,840
- Issue date May 31, 2005
- TDK Corporation
- Masashi Shiraishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head device
- Patent number 6,522,502
- Issue date Feb 18, 2003
- TDK Corporation
- Masashi Shiraishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head device
- Patent number 6,084,746
- Issue date Jul 4, 2000
- TDK Corporation
- Masashi Shiraishi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR
- Publication number 20240377484
- Publication date Nov 14, 2024
- TDK Corporation
- Kentaro HARADA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20230384401
- Publication date Nov 30, 2023
- TDK Corporation
- Kentaro HARADA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR, AND A CURRENT SENSOR AND POSITION DETECTION DEVICE...
- Publication number 20230052013
- Publication date Feb 16, 2023
- TDK Corporation
- Kenichi TAKANO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20220334201
- Publication date Oct 20, 2022
- TDK Corporation
- Kentaro HARADA
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR HAVING SOFT MAGNETIC BODIES FOR ADJUSTING MAGNETIC F...
- Publication number 20220187344
- Publication date Jun 16, 2022
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR, AND A CURRENT SENSOR AND POSITION DETECTION DEVICE...
- Publication number 20220065956
- Publication date Mar 3, 2022
- TDK Corporation
- Kenichi TAKANO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE
- Publication number 20210247465
- Publication date Aug 12, 2021
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20210208215
- Publication date Jul 8, 2021
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20210123992
- Publication date Apr 29, 2021
- TDK Corporation
- Kentaro HARADA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20200300667
- Publication date Sep 24, 2020
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TEST SYSTEM
- Publication number 20200132720
- Publication date Apr 30, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20200132786
- Publication date Apr 30, 2020
- TDK Corporation
- Kenichi TAKANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC SENSOR
- Publication number 20200116804
- Publication date Apr 16, 2020
- TDK Corporation
- Kenichi TAKANO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE
- Publication number 20190377032
- Publication date Dec 12, 2019
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR DEVICE AND CURRENT SENSOR
- Publication number 20190086447
- Publication date Mar 21, 2019
- TDK Corporation
- Kenichi TAKANO
- G01 - MEASURING TESTING
Information Patent Application
OFFSET ESTIMATION APPARATUS AND METHOD, CORRECTION APPARATUS FOR MA...
- Publication number 20190033347
- Publication date Jan 31, 2019
- TDK Corporation
- Kenichi Takano
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR
- Publication number 20180356448
- Publication date Dec 13, 2018
- TDK Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY-ASSISTED MAGNETIC WRITE HEAD, HEAD GIMBAL ASSEMBLY, HEAD...
- Publication number 20140098439
- Publication date Apr 10, 2014
- TDK Corporation
- Kenichi TAKANO
- G02 - OPTICS
Information Patent Application
Perpendicular Magnetic Recording Write Head with Milling Defined Tr...
- Publication number 20130286508
- Publication date Oct 31, 2013
- Kenichi Takano
- G11 - INFORMATION STORAGE
Information Patent Application
Heat Assisted Narrow Pole Design with Trailing Shield
- Publication number 20130140268
- Publication date Jun 6, 2013
- HEADWAY TECHNOLOGIES, INC.
- Xuhui Jin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Perpendicular spin torque oscillator FMR frequency measurement method
- Publication number 20130069626
- Publication date Mar 21, 2013
- TDK Corporation & Kabushiki Kaisha Toshiba
- Yuchen Zhou
- G01 - MEASURING TESTING

Kenichi Takano

Person

Patents Grantslast 30 patents

Magnetic sensor

Current sensor having soft magnetic bodies for adjusting magnetic f...

Magnetic sensor

Magnetic sensor, and a current sensor and position detection device...

Magnetic sensor

Magnetic field detection device

Magnetic sensor, and a current sensor and position detection device...

Magnetic sensor

Current sensor having soft magnetic bodies for adjusting magnetic f...

Magnetic sensor device and current sensor

Magnetic sensor

Magnetic field detection device

Magnetic sensor

Offset estimation apparatus and method, correction apparatus for ma...

Semiconductor wafer test system

Perpendicular spin torque oscillator FMR frequency measurement method

Heat assisted narrow pole design with trailing shield

Thermally-assisted magnetic write head, head gimbal assembly, head...

Perpendicular magnetic recording write head with milling defined tr...

Method for characterization evaluation of thermally-assisted magnet...

Method of fabricating a magnetic head device

Magnetic head device

Magnetic head device

Patents Applicationslast 30 patents

MAGNETIC SENSOR

MAGNETIC SENSOR

MAGNETIC SENSOR, AND A CURRENT SENSOR AND POSITION DETECTION DEVICE...

MAGNETIC SENSOR

CURRENT SENSOR HAVING SOFT MAGNETIC BODIES FOR ADJUSTING MAGNETIC F...

MAGNETIC SENSOR, AND A CURRENT SENSOR AND POSITION DETECTION DEVICE...

MAGNETIC FIELD DETECTION DEVICE

MAGNETIC SENSOR

MAGNETIC SENSOR

MAGNETIC SENSOR

SEMICONDUCTOR WAFER TEST SYSTEM

MAGNETIC SENSOR

MAGNETIC SENSOR

MAGNETIC FIELD DETECTION DEVICE

MAGNETIC SENSOR DEVICE AND CURRENT SENSOR

OFFSET ESTIMATION APPARATUS AND METHOD, CORRECTION APPARATUS FOR MA...

CURRENT SENSOR

THERMALLY-ASSISTED MAGNETIC WRITE HEAD, HEAD GIMBAL ASSEMBLY, HEAD...

Perpendicular Magnetic Recording Write Head with Milling Defined Tr...

Heat Assisted Narrow Pole Design with Trailing Shield

Perpendicular spin torque oscillator FMR frequency measurement method