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Kenichi Takasu
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Positioning system and method
Patent number
9,213,104
Issue date
Dec 15, 2015
Kabushiki Kaisha Topcon
Kazuhiro Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
RTK-GPS survey system
Patent number
7,482,974
Issue date
Jan 27, 2009
Kabushiki Kaisha Topcon
Kazuhiro Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
RTK-GPS surveying system
Patent number
7,460,065
Issue date
Dec 2, 2008
Kabushiki Kaisha Topcon
Kazuhiro Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining position
Patent number
6,882,305
Issue date
Apr 19, 2005
Mitsui & Co., Ltd.
Koji Miyasaka
G01 - MEASURING TESTING
Information
Patent Grant
Satellite position measurement system
Patent number
6,865,484
Issue date
Mar 8, 2005
Mitsui & Co., Ltd.
Koji Miyasaka
G01 - MEASURING TESTING
Information
Patent Grant
GPS positioning system
Patent number
6,791,492
Issue date
Sep 14, 2004
Mitsui & Co., Ltd.
Koji Miyasaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POSITIONING SYSTEM AND RECEIVING TERMINAL USED THEREIN
Publication number
20080281520
Publication date
Nov 13, 2008
Kazuhiro Ogawa
G01 - MEASURING TESTING
Information
Patent Application
RTK-GPS survey system
Publication number
20070268179
Publication date
Nov 22, 2007
Kabushiki Kaisha TOPCON
Kazuhiro Ogawa
G01 - MEASURING TESTING
Information
Patent Application
RTK-GPS surveying system
Publication number
20070241961
Publication date
Oct 18, 2007
Kabushiki Kaisha TOPCON
Kazuhiro Ogawa
G01 - MEASURING TESTING
Information
Patent Application
Satellite positioning system
Publication number
20040044474
Publication date
Mar 4, 2004
Koji Miyasaka
G01 - MEASURING TESTING
Information
Patent Application
Satellite position measurement system
Publication number
20030154026
Publication date
Aug 14, 2003
Koji Miyasaka
G01 - MEASURING TESTING
Information
Patent Application
GPS positioning system
Publication number
20030090415
Publication date
May 15, 2003
MITSUI & CO., LTD.
Koji Miyasaka
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for determining position
Publication number
20030016171
Publication date
Jan 23, 2003
MITSUI & CO., LTD. & KABUSHIKI KAISHA TOPCON
Koji Miyasaka
G01 - MEASURING TESTING