Kenichi Yagi

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer

    • Patent number 11,719,714
    • Issue date Aug 8, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer

    • Patent number 11,656,238
    • Issue date May 23, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takashi Nakasawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD AND SYSTEM OF MANAGING SAMPLE PRIORITIES

    • Publication number 20240013873
    • Publication date Jan 11, 2024
    • Roche Diagnostics Operations, Inc.
    • Daniel Laubert
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE STORAGE DEVICE

    • Publication number 20230333129
    • Publication date Oct 19, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shota AOYAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20230184795
    • Publication date Jun 15, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kohei YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20220034923
    • Publication date Feb 3, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kenichi YAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer

    • Publication number 20210349114
    • Publication date Nov 11, 2021
    • Hitachi High-Tech Corporation
    • Kanoh SHIMIZU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20200264206
    • Publication date Aug 20, 2020
    • Hitachi High-Technologies Corporation
    • Sayaka SARWAR
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20190346468
    • Publication date Nov 14, 2019
    • Hitachi High-Technologies Corporation
    • Takashi NAKASAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Gaming machine and game article

    • Publication number 20060183543
    • Publication date Aug 17, 2006
    • AZURE CORP.
    • Kenichi Yagi
    • G07 - CHECKING-DEVICES